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X-RAY DIFFRACTION
Materials and Methods page
4GAG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 295.0
    Details 18% PEG 8K, 0.1M TrisHCl, 0.2M CaCl2, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 127.65 α = 90
    b = 56.9 β = 113.9
    c = 81.8 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944
    Collection Date 2010-07-05
     
    Diffraction Radiation
    Monochromator graphite
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.8
    Resolution(Low) 50
    Number Reflections(All) 49991
    Number Reflections(Observed) 49991
    Percent Possible(Observed) 98.28
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 23.11
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 49991
    Number of Reflections(Observed) 46640
    Number of Reflections(R-Free) 2492
    Percent Reflections(Observed) 98.28
    R-Factor(Observed) 0.17935
    R-Work 0.17765
    R-Free 0.21092
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 24.877
    Anisotropic B[1][1] -1.21
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.33
    Anisotropic B[2][2] -0.11
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.04
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.799
    Shell Resolution(Low) 1.845
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2859
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.295
    Percent Reflections(Observed) 82.18
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 5.474
    r_scbond_it 3.455
    r_mcangle_it 2.466
    r_mcbond_it 1.469
    r_gen_planes_refined 0.013
    r_chiral_restr 0.196
    r_dihedral_angle_4_deg 22.4
    r_dihedral_angle_3_deg 13.296
    r_dihedral_angle_2_deg 36.552
    r_dihedral_angle_1_deg 7.197
    r_angle_refined_deg 2.211
    r_bond_refined_d 0.028
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3384
    Nucleic Acid Atoms 0
    Heterogen Atoms 12
    Solvent Atoms 346
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building Phaser
    data collection CrystalClear