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X-RAY DIFFRACTION
Materials and Methods page
4G9G
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.3
    Temperature 293.0
    Details 35% PEG8000, 0.2M LiAc, 0.1M NaAc, pH 6.3, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.38 α = 90
    b = 129.57 β = 111.02
    c = 44.73 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 180
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-07-22
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL44XU
    Wavelength List 1
    Site SPRING-8
    Beamline BL44XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.35
    Resolution(Low) 20
    Number Reflections(Observed) 96822
    Percent Possible(Observed) 51.4
    B(Isotropic) From Wilson Plot 9.81
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.4
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.35
    Resolution(Low) 19.869
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 95339
    Number of Reflections(R-Free) 4770
    Percent Reflections(Observed) 96.97
    R-Factor(Observed) 0.143
    R-Work 0.1412
    R-Free 0.1775
     
    Temperature Factor Modeling
    Mean Isotropic B Value 18.6257
    Anisotropic B[1][1] 1.8825
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.8861
    Anisotropic B[2][2] -3.8798
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.9973
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.35
    Shell Resolution(Low) 1.3982
    Number of Reflections(R-Free) 442
    Number of Reflections(R-Work) 8915
    R-Factor(R-Work) 0.1888
    R-Factor(R-Free) 0.2246
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3982
    Shell Resolution(Low) 1.4542
    Number of Reflections(R-Free) 457
    Number of Reflections(R-Work) 8924
    R-Factor(R-Work) 0.1612
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4542
    Shell Resolution(Low) 1.5204
    Number of Reflections(R-Free) 440
    Number of Reflections(R-Work) 8975
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1784
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5204
    Shell Resolution(Low) 1.6005
    Number of Reflections(R-Free) 508
    Number of Reflections(R-Work) 9011
    R-Factor(R-Work) 0.1351
    R-Factor(R-Free) 0.1688
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6005
    Shell Resolution(Low) 1.7007
    Number of Reflections(R-Free) 478
    Number of Reflections(R-Work) 9059
    R-Factor(R-Work) 0.1309
    R-Factor(R-Free) 0.1676
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7007
    Shell Resolution(Low) 1.832
    Number of Reflections(R-Free) 505
    Number of Reflections(R-Work) 9087
    R-Factor(R-Work) 0.1374
    R-Factor(R-Free) 0.1734
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.832
    Shell Resolution(Low) 2.0161
    Number of Reflections(R-Free) 471
    Number of Reflections(R-Work) 9197
    R-Factor(R-Work) 0.1385
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0161
    Shell Resolution(Low) 2.3075
    Number of Reflections(R-Free) 492
    Number of Reflections(R-Work) 9193
    R-Factor(R-Work) 0.1388
    R-Factor(R-Free) 0.1758
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3075
    Shell Resolution(Low) 2.9058
    Number of Reflections(R-Free) 496
    Number of Reflections(R-Work) 9254
    R-Factor(R-Work) 0.1444
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9058
    Shell Resolution(Low) 19.8714
    Number of Reflections(R-Free) 481
    Number of Reflections(R-Work) 8954
    R-Factor(R-Work) 0.1371
    R-Factor(R-Free) 0.1733
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.097
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_angle_d 1.046
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4223
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 1055
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHENIX
    data collection ADSC version: Quantum