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X-RAY DIFFRACTION
Materials and Methods page
4G9C
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 9
    Temperature 293.0
    Details 100 mM Tris pH 9.0, PEG 8000, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.05 α = 90
    b = 107.05 β = 90
    c = 161.85 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315
    Collection Date 2008-07-22
     
    Diffraction Radiation
    Monochromator Synchrotron silicon crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL7-1
    Wavelength List 0.979
    Site SSRL
    Beamline BL7-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.5
    Resolution(Low) 30
    Number Reflections(All) 12292
    Number Reflections(Observed) 11862
    Percent Possible(Observed) 96.5
    R Merge I(Observed) 0.111
    B(Isotropic) From Wilson Plot 155.5
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 3.5
    Resolution(Low) 3.69
    Percent Possible(All) 97.4
    R Merge I(Observed) 0.369
    Mean I Over Sigma(Observed) 2.0
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.5
    Resolution(Low) 29.76
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 11851
    Number of Reflections(Observed) 11851
    Number of Reflections(R-Free) 723
    Percent Reflections(Observed) 95.3
    R-Factor(Observed) 0.262
    R-Work 0.26
    R-Free 0.291
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 52.2
    Anisotropic B[1][1] -9.14
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -9.14
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 18.29
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5
    Shell Resolution(Low) 3.72
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 1831
    R-Factor(R-Work) 0.296
    R-Factor(R-Free) 0.336
    R-Free Error 0.031
    Percent Reflections(Observed) 96.8
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.66
    c_scbond_it 1.5
    c_mcangle_it 3.15
    c_mcbond_it 1.7
    c_improper_angle_d 0.6
    c_dihedral_angle_d 22.6
    c_angle_deg 0.9
    c_bond_d 0.007
     
    Coordinate Error
    Luzzati ESD(Observed) 0.4
    Luzzati Sigma A(Observed) 0.5
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.47
    Luzzati Sigma A(R-Free Set) 0.52
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4215
    Nucleic Acid Atoms 0
    Heterogen Atoms 72
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu-Ice
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution CNS
    Structure Refinement CNX 2005
     
    Software
    refinement CNX version: 2005
    model building CNS
    data collection Blu-Ice