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X-RAY DIFFRACTION
Materials and Methods page
4G94
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 295.0
    Details 0.1M MES pH 6.5, 12% 1-propanol, 10% PEG5000 MME, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 38.38 α = 90
    b = 64.72 β = 90
    c = 108.72 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 70
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-10-19
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List .97918
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.3
    Observed Criterion Sigma(I) 2.75
    Resolution(High) 2
    Resolution(Low) 30
    Number Reflections(All) 19002
    Number Reflections(Observed) 18679
    Percent Possible(Observed) 98.0
     
    High Resolution Shell Details
    Resolution(High) 1.997
    Resolution(Low) 2.1
    Percent Possible(All) 98.3
    Mean I Over Sigma(Observed) 2.75
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.9971
    Resolution(Low) 26.35
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 18678
    Number of Reflections(R-Free) 935
    Percent Reflections(Observed) 97.95
    R-Factor(Observed) 0.2065
    R-Work 0.2046
    R-Free 0.2426
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9971
    Shell Resolution(Low) 2.1023
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2481
    R-Factor(R-Work) 0.3322
    R-Factor(R-Free) 0.3846
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1023
    Shell Resolution(Low) 2.234
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2524
    R-Factor(R-Work) 0.2746
    R-Factor(R-Free) 0.3076
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.234
    Shell Resolution(Low) 2.4063
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2551
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.2586
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4063
    Shell Resolution(Low) 2.6483
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2531
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.2996
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6483
    Shell Resolution(Low) 3.031
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.2112
    R-Factor(R-Free) 0.2426
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.031
    Shell Resolution(Low) 3.8169
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.2431
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8169
    Shell Resolution(Low) 26.3524
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2475
    R-Factor(R-Work) 0.1804
    R-Factor(R-Free) 0.2051
    Percent Reflections(Observed) 90.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.106
    f_dihedral_angle_d 14.906
    f_angle_d 1.431
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2076
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 54
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building SHARP
    data collection HKL-2000