POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4G8D
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 293.0
    Details 30% PEG8000, 0.2M LiAc, 0.1M NaAc, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.43 α = 90
    b = 129.94 β = 110.84
    c = 44.39 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 180
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-07-22
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SPRING-8 BEAMLINE BL44XU
    Wavelength List 1
    Site SPRING-8
    Beamline BL44XU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.35
    Resolution(Low) 20
    Number Reflections(Observed) 99376
    Percent Possible(Observed) 50.4
    B(Isotropic) From Wilson Plot 9.23
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.4
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.35
    Resolution(Low) 19.825
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 97703
    Number of Reflections(R-Free) 4879
    Percent Reflections(Observed) 99.62
    R-Factor(Observed) 0.1347
    R-Work 0.133
    R-Free 0.1675
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.8113
    Anisotropic B[1][1] 1.3339
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.927
    Anisotropic B[2][2] -1.7726
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.4386
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.35
    Shell Resolution(Low) 1.3982
    Number of Reflections(R-Free) 514
    Number of Reflections(R-Work) 9231
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3982
    Shell Resolution(Low) 1.4542
    Number of Reflections(R-Free) 474
    Number of Reflections(R-Work) 9262
    R-Factor(R-Work) 0.1476
    R-Factor(R-Free) 0.1698
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4542
    Shell Resolution(Low) 1.5204
    Number of Reflections(R-Free) 510
    Number of Reflections(R-Work) 9259
    R-Factor(R-Work) 0.1354
    R-Factor(R-Free) 0.1575
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5204
    Shell Resolution(Low) 1.6005
    Number of Reflections(R-Free) 486
    Number of Reflections(R-Work) 9228
    R-Factor(R-Work) 0.1263
    R-Factor(R-Free) 0.1537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6005
    Shell Resolution(Low) 1.7007
    Number of Reflections(R-Free) 518
    Number of Reflections(R-Work) 9300
    R-Factor(R-Work) 0.124
    R-Factor(R-Free) 0.1675
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7007
    Shell Resolution(Low) 1.832
    Number of Reflections(R-Free) 509
    Number of Reflections(R-Work) 9246
    R-Factor(R-Work) 0.1255
    R-Factor(R-Free) 0.1589
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.832
    Shell Resolution(Low) 2.0161
    Number of Reflections(R-Free) 476
    Number of Reflections(R-Work) 9319
    R-Factor(R-Work) 0.1305
    R-Factor(R-Free) 0.1707
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0161
    Shell Resolution(Low) 2.3075
    Number of Reflections(R-Free) 452
    Number of Reflections(R-Work) 9291
    R-Factor(R-Work) 0.13
    R-Factor(R-Free) 0.1614
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3075
    Shell Resolution(Low) 2.9058
    Number of Reflections(R-Free) 459
    Number of Reflections(R-Work) 9353
    R-Factor(R-Work) 0.1411
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9058
    Shell Resolution(Low) 19.8272
    Number of Reflections(R-Free) 481
    Number of Reflections(R-Work) 9335
    R-Factor(R-Work) 0.1276
    R-Factor(R-Free) 0.1604
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.296
    f_plane_restr 0.005
    f_chiral_restr 0.069
    f_angle_d 1.035
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4226
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 1138
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHENIX
    data collection ADSC version: Quantum