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X-RAY DIFFRACTION
Materials and Methods page
4G8C
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.3
    Temperature 293.0
    Details 35% PEG8000, 0.2M LiAc, 0.1M NaAc, pH 6.3, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.42 α = 90
    b = 129.6 β = 111.19
    c = 44.83 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 180
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 1
    Collection Date 2011-06-22
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.89
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.11
    Resolution(Low) 20
    Number Reflections(Observed) 186917
    Percent Possible(Observed) 51.4
    B(Isotropic) From Wilson Plot 7.94
     
    High Resolution Shell Details
    Resolution(High) 1.11
    Resolution(Low) 1.13
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.11
    Resolution(Low) 19.892
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 171522
    Number of Reflections(R-Free) 8509
    Percent Reflections(Observed) 96.85
    R-Factor(Observed) 0.1359
    R-Work 0.1347
    R-Free 0.1583
     
    Temperature Factor Modeling
    Mean Isotropic B Value 15.3265
    Anisotropic B[1][1] 3.3508
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.6976
    Anisotropic B[2][2] -3.282
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.2521
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.11
    Shell Resolution(Low) 1.1497
    Number of Reflections(R-Free) 820
    Number of Reflections(R-Work) 16090
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1497
    Shell Resolution(Low) 1.1957
    Number of Reflections(R-Free) 901
    Number of Reflections(R-Work) 16024
    R-Factor(R-Work) 0.141
    R-Factor(R-Free) 0.1644
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1957
    Shell Resolution(Low) 1.2501
    Number of Reflections(R-Free) 829
    Number of Reflections(R-Work) 16299
    R-Factor(R-Work) 0.1252
    R-Factor(R-Free) 0.1544
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2501
    Shell Resolution(Low) 1.316
    Number of Reflections(R-Free) 876
    Number of Reflections(R-Work) 16273
    R-Factor(R-Work) 0.1144
    R-Factor(R-Free) 0.1458
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.316
    Shell Resolution(Low) 1.3984
    Number of Reflections(R-Free) 819
    Number of Reflections(R-Work) 16447
    R-Factor(R-Work) 0.1134
    R-Factor(R-Free) 0.1504
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3984
    Shell Resolution(Low) 1.5064
    Number of Reflections(R-Free) 845
    Number of Reflections(R-Work) 16520
    R-Factor(R-Work) 0.1087
    R-Factor(R-Free) 0.1362
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5064
    Shell Resolution(Low) 1.6579
    Number of Reflections(R-Free) 869
    Number of Reflections(R-Work) 16620
    R-Factor(R-Work) 0.1086
    R-Factor(R-Free) 0.1361
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6579
    Shell Resolution(Low) 1.8976
    Number of Reflections(R-Free) 877
    Number of Reflections(R-Work) 16701
    R-Factor(R-Work) 0.1256
    R-Factor(R-Free) 0.1519
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8976
    Shell Resolution(Low) 2.3902
    Number of Reflections(R-Free) 857
    Number of Reflections(R-Work) 16842
    R-Factor(R-Work) 0.1316
    R-Factor(R-Free) 0.1444
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3902
    Shell Resolution(Low) 19.8955
    Number of Reflections(R-Free) 816
    Number of Reflections(R-Work) 15197
    R-Factor(R-Work) 0.1592
    R-Factor(R-Free) 0.181
    Percent Reflections(Observed) 90.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.517
    f_plane_restr 0.006
    f_chiral_restr 0.076
    f_angle_d 1.09
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4211
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 887
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHENIX
    data collection ADSC version: Quantum