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X-RAY DIFFRACTION
Materials and Methods page
4G8B
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 293.0
    Details 30% PEG8000, 0.2M LiAc, 0.1M NaAc, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.38 α = 90
    b = 130.07 β = 110.68
    c = 44.25 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 180
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-06-22
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.89
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.3
    Resolution(Low) 27.51
    Number Reflections(Observed) 108060
    Percent Possible(Observed) 50.5
     
    High Resolution Shell Details
    Resolution(High) 1.302
    Resolution(Low) 1.33
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.302
    Resolution(Low) 27.51
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 107811
    Number of Reflections(R-Free) 5266
    Percent Reflections(Observed) 98.71
    R-Factor(All) 0.15
    R-Factor(Observed) 0.1237
    R-Work 0.1218
    R-Free 0.1586
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.9074
    Anisotropic B[1][1] 2.3934
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.7543
    Anisotropic B[2][2] -0.9133
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.4801
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3015
    Shell Resolution(Low) 1.348
    Number of Reflections(R-Free) 459
    Number of Reflections(R-Work) 9651
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.223
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.348
    Shell Resolution(Low) 1.402
    Number of Reflections(R-Free) 507
    Number of Reflections(R-Work) 10375
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.1994
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.402
    Shell Resolution(Low) 1.4658
    Number of Reflections(R-Free) 547
    Number of Reflections(R-Work) 10345
    R-Factor(R-Work) 0.1201
    R-Factor(R-Free) 0.1788
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4658
    Shell Resolution(Low) 1.5431
    Number of Reflections(R-Free) 524
    Number of Reflections(R-Work) 10346
    R-Factor(R-Work) 0.1076
    R-Factor(R-Free) 0.1628
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5431
    Shell Resolution(Low) 1.6397
    Number of Reflections(R-Free) 528
    Number of Reflections(R-Work) 10382
    R-Factor(R-Work) 0.0965
    R-Factor(R-Free) 0.151
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6397
    Shell Resolution(Low) 1.7663
    Number of Reflections(R-Free) 555
    Number of Reflections(R-Work) 10348
    R-Factor(R-Work) 0.0984
    R-Factor(R-Free) 0.1547
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7663
    Shell Resolution(Low) 1.944
    Number of Reflections(R-Free) 558
    Number of Reflections(R-Work) 10318
    R-Factor(R-Work) 0.1042
    R-Factor(R-Free) 0.1462
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.944
    Shell Resolution(Low) 2.2252
    Number of Reflections(R-Free) 525
    Number of Reflections(R-Work) 10408
    R-Factor(R-Work) 0.1174
    R-Factor(R-Free) 0.1479
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2252
    Shell Resolution(Low) 2.8031
    Number of Reflections(R-Free) 552
    Number of Reflections(R-Work) 10348
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.1596
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8031
    Shell Resolution(Low) 27.5197
    Number of Reflections(R-Free) 511
    Number of Reflections(R-Work) 10024
    R-Factor(R-Work) 0.1331
    R-Factor(R-Free) 0.1536
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.925
    f_plane_restr 0.005
    f_chiral_restr 0.071
    f_angle_d 1.078
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4207
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 914
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHENIX
    data collection ADSC version: Quantum