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X-RAY DIFFRACTION
Materials and Methods page
4G7N
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 300.0
    Details an equal volume of 7.2 mg/ml Plk4 PB1-PB2 and well solution containing 1.2 M Li2SO4, 100 mM Hepes, pH 7.5 were mixed together and equilibrated over 1 ml of well solution., VAPOR DIFFUSION, HANGING DROP, temperature 300K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 86.77 α = 90
    b = 135.58 β = 90
    c = 46.67 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2010-10-01
     
    Diffraction Radiation
    Monochromator APS ID22 Monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00890
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.3
    Resolution(Low) 31.8
    Number Reflections(All) 25256
    Number Reflections(Observed) 22051
    Percent Possible(Observed) 89.3
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.38
    Percent Possible(All) 84.7
    Mean I Over Sigma(Observed) 3.8
    R-Sym I(Observed) 0.334
    Number Unique Reflections(All) 1780
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.3
    Resolution(Low) 31.776
    Cut-off Sigma(F) 0.1
    Number of Reflections(all) 25256
    Number of Reflections(Observed) 22051
    Number of Reflections(R-Free) 1889
    Percent Reflections(Observed) 87.31
    R-Factor(All) 0.1908
    R-Factor(Observed) 0.1908
    R-Work 0.1847
    R-Free 0.2554
    R-Free Selection Details 10
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.3668
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.1324
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.4991
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2995
    Shell Resolution(Low) 2.3817
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1630
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.3071
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3817
    Shell Resolution(Low) 2.477
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 1819
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.2938
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.477
    Shell Resolution(Low) 2.5897
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 1848
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.3027
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5897
    Shell Resolution(Low) 2.7261
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 1897
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.3005
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7261
    Shell Resolution(Low) 2.8968
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 2017
    R-Factor(R-Work) 0.2128
    R-Factor(R-Free) 0.3
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8968
    Shell Resolution(Low) 3.1203
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 2106
    R-Factor(R-Work) 0.211
    R-Factor(R-Free) 0.2954
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1203
    Shell Resolution(Low) 3.434
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 2184
    R-Factor(R-Work) 0.1944
    R-Factor(R-Free) 0.2749
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.434
    Shell Resolution(Low) 3.9301
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 2144
    R-Factor(R-Work) 0.1661
    R-Factor(R-Free) 0.2202
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9301
    Shell Resolution(Low) 4.9485
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 2224
    R-Factor(R-Work) 0.1353
    R-Factor(R-Free) 0.1925
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9485
    Shell Resolution(Low) 31.7794
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 2293
    R-Factor(R-Work) 0.1766
    R-Factor(R-Free) 0.2385
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 14.623
    f_angle_d 1.09
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3478
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 184
     
     
  •   Software and Computing Hide
    Computing
    Data Collection sergui
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phenix
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building Phenix
    data collection sergui