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X-RAY DIFFRACTION
Materials and Methods page
4G6V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.2
    Temperature 298.0
    Details 0.49 M sodium phosphate monobasic, 0.96 M potassium phosphate dibasic, 10 mM triethylene glycol, 504 nM chymotrypsin, pH 7.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 151.96 α = 90
    b = 173.65 β = 90
    c = 174.82 γ = 90
     
    Space Group
    Space Group Name:    F 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-06-11
     
    Diffraction Radiation
    Monochromator Double crystal, Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.1
    Wavelength List 0.92
    Site ALS
    Beamline 8.2.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.64
    Resolution(Low) 43.4
    Number Reflections(Observed) 34071
    Percent Possible(Observed) 99.47
    Redundancy 29.6
     
    High Resolution Shell Details
    Resolution(High) 2.64
    Resolution(Low) 2.74
    Percent Possible(All) 100.0
    Redundancy 30.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.64
    Resolution(Low) 43.4
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 33975
    Number of Reflections(R-Free) 1720
    Percent Reflections(Observed) 99.47
    R-Factor(Observed) 0.2065
    R-Work 0.2045
    R-Free 0.2452
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 40.7875
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -22.6511
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -18.1364
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.64
    Shell Resolution(Low) 2.7135
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.2642
    R-Factor(R-Free) 0.3221
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7135
    Shell Resolution(Low) 2.8011
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.3208
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8011
    Shell Resolution(Low) 2.9012
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.2326
    R-Factor(R-Free) 0.2477
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9012
    Shell Resolution(Low) 3.0173
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.3066
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0173
    Shell Resolution(Low) 3.1546
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.2392
    R-Factor(R-Free) 0.3069
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1546
    Shell Resolution(Low) 3.3208
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2361
    R-Factor(R-Free) 0.2459
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3208
    Shell Resolution(Low) 3.5288
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.2201
    R-Factor(R-Free) 0.2866
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5288
    Shell Resolution(Low) 3.8011
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1879
    R-Factor(R-Free) 0.236
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8011
    Shell Resolution(Low) 4.1834
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1661
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1834
    Shell Resolution(Low) 4.788
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.788
    Shell Resolution(Low) 6.0299
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0299
    Shell Resolution(Low) 43.4194
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2804
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2407
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.076
    f_dihedral_angle_d 13.376
    f_angle_d 1.186
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6928
    Nucleic Acid Atoms 0
    Heterogen Atoms 8
    Solvent Atoms 33
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX
    data collection HKL-2000