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X-RAY DIFFRACTION
Materials and Methods page
4G6U
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 298.0
    Details 0.1 M sodium acetate pH 5.5, 0.2 M NaCl. 18% PEG-6000, 10 mM yttrium chloride, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.7 α = 90
    b = 103.63 β = 90
    c = 125.17 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-05-20
     
    Diffraction Radiation
    Monochromator Double crystal, Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.1
    Wavelength List .979
    Site ALS
    Beamline 8.2.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.35
    Resolution(Low) 39.9
    Number Reflections(Observed) 22419
    Percent Possible(Observed) 99.7
    Redundancy 14.3
     
    High Resolution Shell Details
    Resolution(High) 2.35
    Resolution(Low) 2.43
    Percent Possible(All) 100.0
    Redundancy 14.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.353
    Resolution(Low) 39.9
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 22333
    Number of Reflections(R-Free) 1145
    Percent Reflections(Observed) 99.72
    R-Factor(Observed) 0.1828
    R-Work 0.1804
    R-Free 0.2287
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 12.8324
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.9227
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.9097
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3531
    Shell Resolution(Low) 2.4602
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.216
    R-Factor(R-Free) 0.2697
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4602
    Shell Resolution(Low) 2.5899
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.2201
    R-Factor(R-Free) 0.2836
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5899
    Shell Resolution(Low) 2.7521
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2163
    R-Factor(R-Free) 0.2793
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7521
    Shell Resolution(Low) 2.9645
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.2121
    R-Factor(R-Free) 0.3096
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9645
    Shell Resolution(Low) 3.2628
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2628
    Shell Resolution(Low) 3.7346
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7346
    Shell Resolution(Low) 4.704
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.704
    Shell Resolution(Low) 39.9179
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_dihedral_angle_d 13.922
    f_angle_d 1.079
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2916
    Nucleic Acid Atoms 0
    Heterogen Atoms 17
    Solvent Atoms 77
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution AFRO/CRUNCH2
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building AFRO/CRUNCH2
    data collection HKL-2000