X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 295.0
Details 0.1M MES pH 6.5, 10% (w/v) PEG5000MME, 12% (v/v) Isopropanol, VAPOR DIFFUSION, SITTING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 38.38 α = 90
b = 64.72 β = 90
c = 108.72 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 70
2 70
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- --
CCD ADSC QUANTUM 315 -- 2009-10-19
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97918 APS 24-ID-C
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97949 APS 24-ID-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 30 98.3 -- -- -- -- 19002 18679 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.997 2.12 98.3 0.879 -- 2.75 5.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.9971 26.35 -- 1.34 19002 18678 935 97.95 -- 0.2065 0.2046 0.2426 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9971 2.1023 -- 130 2481 0.3322 0.3846 -- 98.0
X Ray Diffraction 2.1023 2.234 -- 133 2524 0.2746 0.3076 -- 99.0
X Ray Diffraction 2.234 2.4063 -- 135 2551 0.2385 0.2586 -- 99.0
X Ray Diffraction 2.4063 2.6483 -- 133 2531 0.2241 0.2996 -- 100.0
X Ray Diffraction 2.6483 3.031 -- 136 2572 0.2112 0.2426 -- 100.0
X Ray Diffraction 3.031 3.8169 -- 137 2609 0.1928 0.2431 -- 100.0
X Ray Diffraction 3.8169 26.3524 -- 131 2475 0.1804 0.2051 -- 90.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.007
f_chiral_restr 0.106
f_dihedral_angle_d 14.906
f_angle_d 1.431
f_bond_d 0.011
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2076
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 54

Software

Computing
Computing Package Purpose
ADSC Quantum Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
SHARP model building
ADSC version: Quantum data collection