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X-RAY DIFFRACTION
Materials and Methods page
4G5X
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.41 α = 90
    b = 129.49 β = 111.11
    c = 44.76 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 180
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-04-26
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-17A
    Wavelength List 1
    Site PHOTON FACTORY
    Beamline BL-17A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.29
    Resolution(Low) 20
    Number Reflections(Observed) 124835
    Percent Possible(Observed) 55.3
    B(Isotropic) From Wilson Plot 11.42
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.29
    Resolution(Low) 19.87
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 93530
    Number of Reflections(R-Free) 4727
    Percent Reflections(Observed) 83.01
    R-Factor(All) 0.15
    R-Factor(Observed) 0.1246
    R-Work 0.1228
    R-Free 0.1579
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.9681
    Anisotropic B[1][1] 1.2813
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.2702
    Anisotropic B[2][2] 0.5155
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.7968
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.29
    Shell Resolution(Low) 1.3361
    Number of Reflections(R-Free) 440
    Number of Reflections(R-Work) 8073
    R-Factor(R-Work) 0.2185
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3361
    Shell Resolution(Low) 1.3896
    Number of Reflections(R-Free) 419
    Number of Reflections(R-Work) 8144
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.2447
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3896
    Shell Resolution(Low) 1.4528
    Number of Reflections(R-Free) 425
    Number of Reflections(R-Work) 8309
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.2174
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4528
    Shell Resolution(Low) 1.5294
    Number of Reflections(R-Free) 473
    Number of Reflections(R-Work) 8468
    R-Factor(R-Work) 0.1126
    R-Factor(R-Free) 0.1784
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5294
    Shell Resolution(Low) 1.6252
    Number of Reflections(R-Free) 500
    Number of Reflections(R-Work) 8521
    R-Factor(R-Work) 0.1008
    R-Factor(R-Free) 0.1581
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6252
    Shell Resolution(Low) 1.7506
    Number of Reflections(R-Free) 419
    Number of Reflections(R-Work) 8614
    R-Factor(R-Work) 0.0976
    R-Factor(R-Free) 0.1429
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7506
    Shell Resolution(Low) 1.9266
    Number of Reflections(R-Free) 484
    Number of Reflections(R-Work) 8596
    R-Factor(R-Work) 0.103
    R-Factor(R-Free) 0.1456
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9266
    Shell Resolution(Low) 2.2051
    Number of Reflections(R-Free) 489
    Number of Reflections(R-Work) 9429
    R-Factor(R-Work) 0.112
    R-Factor(R-Free) 0.1434
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2051
    Shell Resolution(Low) 2.777
    Number of Reflections(R-Free) 556
    Number of Reflections(R-Work) 10275
    R-Factor(R-Work) 0.1217
    R-Factor(R-Free) 0.1514
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.777
    Shell Resolution(Low) 19.872
    Number of Reflections(R-Free) 522
    Number of Reflections(R-Work) 10374
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.1475
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.386
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_angle_d 1.064
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4216
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 903
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASES
    data collection ADSC version: Quantum