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X-RAY DIFFRACTION
Materials and Methods page
4G3Y
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.2
    Temperature 291.0
    Details 1.0M Na/K phosphate, pH 8.2, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 153.66 α = 90
    b = 153.66 β = 90
    c = 99.28 γ = 120
     
    Space Group
    Space Group Name:    H 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-09-05
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE BL-17A
    Wavelength List 1.0000
    Site PHOTON FACTORY
    Beamline BL-17A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(All) 27113
    Number Reflections(Observed) 27025
    Percent Possible(Observed) 99.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 21.535
    Cut-off Sigma(F) 0.08
    Number of Reflections(all) 27025
    Number of Reflections(Observed) 25400
    Number of Reflections(R-Free) 1278
    Percent Reflections(Observed) 94.55
    R-Factor(All) 0.1985
    R-Factor(Observed) 0.1914
    R-Work 0.189
    R-Free 0.2348
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 38.9057
    Anisotropic B[1][1] -1.6239
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.6239
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.2478
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6001
    Shell Resolution(Low) 2.704
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2366
    R-Factor(R-Work) 0.2485
    R-Factor(R-Free) 0.3149
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.704
    Shell Resolution(Low) 2.8268
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2483
    R-Factor(R-Work) 0.2452
    R-Factor(R-Free) 0.3081
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8268
    Shell Resolution(Low) 2.9755
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.248
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9755
    Shell Resolution(Low) 3.1613
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2725
    R-Factor(R-Work) 0.2308
    R-Factor(R-Free) 0.3108
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1613
    Shell Resolution(Low) 3.4046
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2152
    R-Factor(R-Free) 0.2614
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4046
    Shell Resolution(Low) 3.7456
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2787
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.2389
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7456
    Shell Resolution(Low) 4.2838
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1925
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2838
    Shell Resolution(Low) 5.3832
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2808
    R-Factor(R-Work) 0.1316
    R-Factor(R-Free) 0.1656
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3832
    Shell Resolution(Low) 21.5356
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2828
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2087
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 16.588
    f_plane_restr 0.005
    f_chiral_restr 0.079
    f_angle_d 1.223
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4465
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 134
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.1_357)
    model building PHENIX
    data collection ADSC version: Quantum