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X-RAY DIFFRACTION
Materials and Methods page
4G3U
  •   Crystallization Hide
    Crystallization Experiments
    Method SITTING DROP
    pH 7.5
    Temperature 277.0
    Details 30% butanol, 0.2 M sodium chloride, 0.1 M Tris, 0.5% N,N-dimethyldodecylamine-N-oxide, pH 7.5, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 105.15 α = 90
    b = 65.81 β = 109
    c = 108.5 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
    Collection Date 2010-10-15
     
    Diffraction Radiation
    Monochromator KOHZU double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4A
    Wavelength List 0.979
    Site NSLS
    Beamline X4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.69
    Resolution(Low) 102.59
    Number Reflections(All) 39473
    Number Reflections(Observed) 36583
    Percent Possible(Observed) 92.7
    R Merge I(Observed) 0.113
    B(Isotropic) From Wilson Plot 45.658
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.689
    Resolution(Low) 2.85
    Percent Possible(All) 92.6
    R Merge I(Observed) 0.625
    Mean I Over Sigma(Observed) 2.34
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.689
    Resolution(Low) 34.196
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 36552
    Number of Reflections(Observed) 36552
    Number of Reflections(R-Free) 1838
    Percent Reflections(Observed) 92.79
    R-Factor(Observed) 0.2218
    R-Work 0.2201
    R-Free 0.2536
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 46.7215
    Anisotropic B[1][1] 3.6729
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 7.2874
    Anisotropic B[2][2] -6.1284
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 7.6137
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.689
    Shell Resolution(Low) 2.7618
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.3208
    R-Factor(R-Free) 0.366
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7618
    Shell Resolution(Low) 2.843
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2819
    R-Factor(R-Free) 0.3729
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.843
    Shell Resolution(Low) 2.9347
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.2686
    R-Factor(R-Free) 0.3084
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9347
    Shell Resolution(Low) 3.0395
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.2586
    R-Factor(R-Free) 0.2874
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0395
    Shell Resolution(Low) 3.1612
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2728
    R-Factor(R-Work) 0.244
    R-Factor(R-Free) 0.2908
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1612
    Shell Resolution(Low) 3.3049
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.3012
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3049
    Shell Resolution(Low) 3.479
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2355
    R-Factor(R-Free) 0.2978
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.479
    Shell Resolution(Low) 3.6967
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.2669
    R-Factor(R-Free) 0.3077
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6967
    Shell Resolution(Low) 3.9818
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.2139
    R-Factor(R-Free) 0.2498
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9818
    Shell Resolution(Low) 4.3817
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.193
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3817
    Shell Resolution(Low) 5.0141
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1592
    R-Factor(R-Free) 0.158
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0141
    Shell Resolution(Low) 6.3107
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2231
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3107
    Shell Resolution(Low) 34.1992
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2041
    R-Factor(R-Free) 0.2297
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.247
    f_plane_restr 0.003
    f_chiral_restr 0.049
    f_angle_d 0.715
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5370
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 287
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: dev_1000)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale