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X-RAY DIFFRACTION
Materials and Methods page
4G3T
  •   Crystallization Hide
    Crystallization Experiments
    Method SITTING DROP
    pH 6.8
    Temperature 277.0
    Details 15-20% isopropanol, 0.2 M sodium citrate, 0.5% N,N-dimethyldodecylamine-N-oxide, pH 6.8, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.15 α = 90
    b = 64.15 β = 90
    c = 275.46 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2010-01-31
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X4C
    Wavelength List 0.979
    Site NSLS
    Beamline X4C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.35
    Resolution(Low) 47.53
    Number Reflections(All) 28709
    Number Reflections(Observed) 28628
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.122
    B(Isotropic) From Wilson Plot 59.372
    Redundancy 9.1
     
    High Resolution Shell Details
    Resolution(High) 2.346
    Resolution(Low) 2.49
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.012
    Mean I Over Sigma(Observed) 2.01
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.346
    Resolution(Low) 43.239
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 28559
    Number of Reflections(Observed) 28559
    Number of Reflections(R-Free) 1288
    Percent Reflections(Observed) 99.51
    R-Factor(Observed) 0.2286
    R-Work 0.2272
    R-Free 0.2556
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 69.4773
    Anisotropic B[1][1] 11.4955
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 11.4955
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -25.5966
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.346
    Shell Resolution(Low) 2.4404
    Number of Reflections(R-Free) 91
    Number of Reflections(R-Work) 3000
    R-Factor(R-Work) 0.3239
    R-Factor(R-Free) 0.3397
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4404
    Shell Resolution(Low) 2.5514
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 3011
    R-Factor(R-Work) 0.3135
    R-Factor(R-Free) 0.3478
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5514
    Shell Resolution(Low) 2.6859
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2980
    R-Factor(R-Work) 0.2768
    R-Factor(R-Free) 0.3267
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6859
    Shell Resolution(Low) 2.8542
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2961
    R-Factor(R-Work) 0.2775
    R-Factor(R-Free) 0.3109
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8542
    Shell Resolution(Low) 3.0745
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3002
    R-Factor(R-Work) 0.2494
    R-Factor(R-Free) 0.342
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0745
    Shell Resolution(Low) 3.3838
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3013
    R-Factor(R-Work) 0.2669
    R-Factor(R-Free) 0.3148
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3838
    Shell Resolution(Low) 3.8731
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3007
    R-Factor(R-Work) 0.2299
    R-Factor(R-Free) 0.2458
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8731
    Shell Resolution(Low) 4.8787
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3096
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8787
    Shell Resolution(Low) 43.2459
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3201
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2395
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 10.999
    f_plane_restr 0.002
    f_chiral_restr 0.052
    f_angle_d 0.724
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2618
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 77
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution SnB
    Structure Refinement PHENIX (phenix.refine: dev_1000)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale