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X-RAY DIFFRACTION
Materials and Methods page
4G39
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.6
    Temperature 293.0
    Details 65 mM KPi/22% PEG8000, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 67.6 α = 90
    b = 77.04 β = 90
    c = 86.85 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-10-16
     
    Diffraction Radiation
    Monochromator Sagittally-focused Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.4
    Resolution(Low) 20
    Number Reflections(Observed) 23255
    Percent Possible(Observed) 85.9
    R Merge I(Observed) 0.085
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 41.3
    R Merge I(Observed) 0.352
    Redundancy 1.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 20.0
    Cut-off Sigma(F) 0.19
    Number of Reflections(all) 15378
    Number of Reflections(Observed) 17495
    Number of Reflections(R-Free) 1505
    Percent Reflections(Observed) 95.56
    R-Factor(Observed) 0.1782
    R-Work 0.1726
    R-Free 0.2375
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 14.4948
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -5.927
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.5678
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4775
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 1239
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.2932
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4775
    Shell Resolution(Low) 2.566
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 1336
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.2687
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.566
    Shell Resolution(Low) 2.6688
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1376
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.3121
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6688
    Shell Resolution(Low) 2.7902
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1429
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2857
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7902
    Shell Resolution(Low) 2.9373
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1467
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.2811
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9373
    Shell Resolution(Low) 3.1213
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1487
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2568
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1213
    Shell Resolution(Low) 3.3622
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1490
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.2489
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3622
    Shell Resolution(Low) 3.7004
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1486
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7004
    Shell Resolution(Low) 4.2354
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1517
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.1905
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2354
    Shell Resolution(Low) 5.3347
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1534
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3347
    Shell Resolution(Low) 43.8653
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1629
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.2373
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 15.285
    f_angle_d 1.316
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3652
    Nucleic Acid Atoms 0
    Heterogen Atoms 78
    Solvent Atoms 117
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement CNS
    data reduction SCALEPACK
    data collection DENZO