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X-RAY DIFFRACTION
Materials and Methods page
4G38
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.6
    Temperature 293.0
    Details 65 mM KPi/22% PEG 8000, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 66.33 α = 90
    b = 76.17 β = 90
    c = 81.46 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-06-30
     
    Diffraction Radiation
    Monochromator Sagitally Focused Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.56
    Resolution(Low) 50
    Number Reflections(Observed) 57746
    Percent Possible(Observed) 97.6
    R Merge I(Observed) 0.055
    Redundancy 5.0
     
    High Resolution Shell Details
    Resolution(High) 1.56
    Resolution(Low) 1.66
    Percent Possible(All) 91.8
    R Merge I(Observed) 0.214
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.56
    Resolution(Low) 22.767
    Cut-off Sigma(F) 0.1
    Number of Reflections(all) 25272
    Number of Reflections(Observed) 57746
    Number of Reflections(R-Free) 1993
    Percent Reflections(Observed) 97.15
    R-Factor(Observed) 0.1414
    R-Work 0.1402
    R-Free 0.1775
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.9417
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.9755
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.9662
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5596
    Shell Resolution(Low) 1.5986
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 3720
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5986
    Shell Resolution(Low) 1.6418
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3831
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6418
    Shell Resolution(Low) 1.6901
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3836
    R-Factor(R-Work) 0.1229
    R-Factor(R-Free) 0.1927
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6901
    Shell Resolution(Low) 1.7446
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3889
    R-Factor(R-Work) 0.1182
    R-Factor(R-Free) 0.1693
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7446
    Shell Resolution(Low) 1.807
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3894
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.1735
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.807
    Shell Resolution(Low) 1.8793
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3921
    R-Factor(R-Work) 0.1191
    R-Factor(R-Free) 0.1761
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8793
    Shell Resolution(Low) 1.9648
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3956
    R-Factor(R-Work) 0.1229
    R-Factor(R-Free) 0.1671
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9648
    Shell Resolution(Low) 2.0683
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4003
    R-Factor(R-Work) 0.1311
    R-Factor(R-Free) 0.1672
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0683
    Shell Resolution(Low) 2.1978
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 4047
    R-Factor(R-Work) 0.1352
    R-Factor(R-Free) 0.1696
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1978
    Shell Resolution(Low) 2.3673
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 4035
    R-Factor(R-Work) 0.1359
    R-Factor(R-Free) 0.1673
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3673
    Shell Resolution(Low) 2.6052
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 4051
    R-Factor(R-Work) 0.1443
    R-Factor(R-Free) 0.1919
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6052
    Shell Resolution(Low) 2.9815
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 4094
    R-Factor(R-Work) 0.1571
    R-Factor(R-Free) 0.1753
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9815
    Shell Resolution(Low) 3.7536
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 4162
    R-Factor(R-Work) 0.1474
    R-Factor(R-Free) 0.1639
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7536
    Shell Resolution(Low) 22.7698
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 4314
    R-Factor(R-Work) 0.1512
    R-Factor(R-Free) 0.1931
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.083
    f_dihedral_angle_d 14.529
    f_angle_d 1.656
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3522
    Nucleic Acid Atoms 0
    Heterogen Atoms 77
    Solvent Atoms 564
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement CNS
    data reduction SCALEPACK
    data collection DENZO