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X-RAY DIFFRACTION
Materials and Methods page
4G2V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 0.2M Sodium Chloride, 0.1M BISTIS PH6.5, 25% PEG 3350, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 93.83 α = 90
    b = 93.83 β = 90
    c = 172.86 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 325 mm CCD
    Collection Date 2011-06-06
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9793
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(All) 18332
    Number Reflections(Observed) 18332
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.103
    B(Isotropic) From Wilson Plot 38.68
    Redundancy 13.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 41.234
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 18248
    Number of Reflections(Observed) 18248
    Number of Reflections(R-Free) 929
    Percent Reflections(Observed) 99.83
    R-Factor(Observed) 0.1916
    R-Work 0.1895
    R-Free 0.2321
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 59.7121
    Anisotropic B[1][1] 6.7753
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 6.7753
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.5506
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4004
    Shell Resolution(Low) 2.5269
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2388
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.2754
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5269
    Shell Resolution(Low) 2.6852
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2388
    R-Factor(R-Work) 0.1977
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6852
    Shell Resolution(Low) 2.8925
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2441
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2763
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8925
    Shell Resolution(Low) 3.1835
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2437
    R-Factor(R-Work) 0.191
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1835
    Shell Resolution(Low) 3.6439
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2476
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6439
    Shell Resolution(Low) 4.5899
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2491
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5899
    Shell Resolution(Low) 41.2402
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.199
    R-Factor(R-Free) 0.2263
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.056
    f_dihedral_angle_d 17.369
    f_angle_d 0.712
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2577
    Nucleic Acid Atoms 0
    Heterogen Atoms 63
    Solvent Atoms 84
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASES
    data collection HKL-2000