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X-RAY DIFFRACTION
Materials and Methods page
4G2U
  •   Crystallization Hide
    Crystallization Experiments
    Method Vapor diffusion, hanging drop
    pH 6.5
    Temperature 293.0
    Details 100mM Bis-Tris, 100mM ammonium sulfate, 25% PEG-3350, pH 6.5, Vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.18 α = 90
    b = 76.29 β = 90
    c = 81.53 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-06-26
     
    Diffraction Radiation
    Monochromator Kirkpatrick-Baez pair of bi-morph mirrors plus channel cut cryogenically cooled monochromator crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SOLEIL BEAMLINE PROXIMA 1
    Wavelength List 0.98
    Site SOLEIL
    Beamline PROXIMA 1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.85
    Resolution(Low) 35.83
    Number Reflections(All) 37078
    Number Reflections(Observed) 37078
    Percent Possible(Observed) 91.7
    B(Isotropic) From Wilson Plot 20.15
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.95
    Percent Possible(All) 77.6
    R Merge I(Observed) 0.415
    Mean I Over Sigma(Observed) 1.2
    R-Sym I(Observed) 0.415
    Redundancy 2.2
    Number Unique Reflections(All) 4489
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 35.835
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 36974
    Number of Reflections(R-Free) 1850
    Percent Reflections(Observed) 90.85
    R-Factor(Observed) 0.1919
    R-Work 0.1893
    R-Free 0.2401
     
    Temperature Factor Modeling
    Mean Isotropic B Value 28.0384
    Anisotropic B[1][1] -3.9568
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.6471
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.604
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.9
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 2133
    R-Factor(R-Work) 0.3384
    R-Factor(R-Free) 0.3927
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9559
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2345
    R-Factor(R-Work) 0.3483
    R-Factor(R-Free) 0.4423
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9559
    Shell Resolution(Low) 2.0191
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2756
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0191
    Shell Resolution(Low) 2.0912
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2193
    R-Factor(R-Work) 0.2349
    R-Factor(R-Free) 0.3577
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0912
    Shell Resolution(Low) 2.1749
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2919
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2711
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1749
    Shell Resolution(Low) 2.2739
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2428
    R-Factor(R-Work) 0.2268
    R-Factor(R-Free) 0.2788
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2739
    Shell Resolution(Low) 2.3938
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2898
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2539
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3938
    Shell Resolution(Low) 2.5437
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2945
    R-Factor(R-Work) 0.1736
    R-Factor(R-Free) 0.2549
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5437
    Shell Resolution(Low) 2.74
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2903
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.226
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.74
    Shell Resolution(Low) 3.0156
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2925
    R-Factor(R-Work) 0.1839
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0156
    Shell Resolution(Low) 3.4517
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2907
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2433
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4517
    Shell Resolution(Low) 4.3476
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2873
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3476
    Shell Resolution(Low) 35.842
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.1779
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.944
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_angle_d 1.134
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3267
    Nucleic Acid Atoms 0
    Heterogen Atoms 19
    Solvent Atoms 458
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) SCALA
    Structure Solution BALBES
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction SCALA version: 3.3.16