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X-RAY DIFFRACTION
Materials and Methods page
4G27
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 298.0
    Details 1.25 M lithium sulfate, 0.5 M ammonium sulfate, 0.1 M sodium citrate, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 76.46 α = 90
    b = 66.87 β = 93.31
    c = 65.13 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-12-08
     
    Diffraction Radiation
    Monochromator double crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 12.3.1
    Wavelength List 1.12
    Site ALS
    Beamline 12.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.65
    Resolution(Low) 50
    Number Reflections(All) 39245
    Number Reflections(Observed) 39245
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.035
    Redundancy 5.0
     
    High Resolution Shell Details
    Resolution(High) 1.65
    Resolution(Low) 1.69
    Percent Possible(All) 99.7
    R Merge I(Observed) 0.645
    Mean I Over Sigma(Observed) 2.3
    Redundancy 5.0
    Number Unique Reflections(All) 2902
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.65
    Resolution(Low) 39.072
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 39243
    Number of Reflections(R-Free) 1934
    Percent Reflections(Observed) 99.41
    R-Factor(Observed) 0.1928
    R-Work 0.191
    R-Free 0.2282
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.8603
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -5.7342
    Anisotropic B[2][2] 1.6059
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.7455
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.65
    Shell Resolution(Low) 1.6913
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.294
    R-Factor(R-Free) 0.3409
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6913
    Shell Resolution(Low) 1.737
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2746
    R-Factor(R-Free) 0.3605
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.737
    Shell Resolution(Low) 1.7881
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.2556
    R-Factor(R-Free) 0.2556
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7881
    Shell Resolution(Low) 1.8458
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.244
    R-Factor(R-Free) 0.28
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8458
    Shell Resolution(Low) 1.9118
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2731
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9118
    Shell Resolution(Low) 1.9883
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2676
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9883
    Shell Resolution(Low) 2.0788
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.2352
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0788
    Shell Resolution(Low) 2.1884
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1884
    Shell Resolution(Low) 2.3255
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.2366
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3255
    Shell Resolution(Low) 2.5051
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5051
    Shell Resolution(Low) 2.7571
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7571
    Shell Resolution(Low) 3.1559
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1559
    Shell Resolution(Low) 3.9755
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.2382
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9755
    Shell Resolution(Low) 39.0825
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.072
    f_dihedral_angle_d 13.243
    f_angle_d 1.264
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1859
    Nucleic Acid Atoms 0
    Heterogen Atoms 33
    Solvent Atoms 208
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blue Ice
    Data Reduction (intensity integration) XDS (xia2)
    Data Reduction (data scaling) XDS (xia2, scala)
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection Blue version: Ice