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X-RAY DIFFRACTION
Materials and Methods page
4G1Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.8
    Temperature 277.0
    Details PEG 8000, AMMONIUM SULFATE, MGCL2,IMIDAZOLE, pH 6.8, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 162.71 α = 90
    b = 72.52 β = 100.84
    c = 109.51 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315
    Collection Date 2009-10-12
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.0
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 1.5
    Resolution(Low) 50
    Number Reflections(Observed) 193097
    Percent Possible(Observed) 96.9
    R Merge I(Observed) 0.055
    Redundancy 6.2
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.53
    Percent Possible(All) 93.3
    R Merge I(Observed) 0.797
    Mean I Over Sigma(Observed) 1.6
    Redundancy 4.0
    Number Unique Reflections(All) 9311
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.51
    Resolution(Low) 35.853
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 195940
    Number of Reflections(Observed) 190062
    Number of Reflections(R-Free) 3833
    Percent Reflections(Observed) 97.0
    R-Factor(All) 0.155
    R-Factor(Observed) 0.155
    R-Work 0.1542
    R-Free 0.1932
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.0783
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.2985
    Anisotropic B[2][2] -2.3632
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.2848
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.51
    Shell Resolution(Low) 1.5291
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6600
    R-Factor(R-Work) 0.3027
    R-Factor(R-Free) 0.3573
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5291
    Shell Resolution(Low) 1.5492
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6648
    R-Factor(R-Work) 0.2727
    R-Factor(R-Free) 0.3184
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5492
    Shell Resolution(Low) 1.5705
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6735
    R-Factor(R-Work) 0.2462
    R-Factor(R-Free) 0.2856
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5705
    Shell Resolution(Low) 1.5929
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 6728
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2567
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5929
    Shell Resolution(Low) 1.6167
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 6747
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2581
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6167
    Shell Resolution(Low) 1.6419
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 6770
    R-Factor(R-Work) 0.1899
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6419
    Shell Resolution(Low) 1.6689
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 6727
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2543
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6689
    Shell Resolution(Low) 1.6976
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6784
    R-Factor(R-Work) 0.1584
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6976
    Shell Resolution(Low) 1.7285
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6720
    R-Factor(R-Work) 0.1422
    R-Factor(R-Free) 0.1847
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7285
    Shell Resolution(Low) 1.7617
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6762
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.1844
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7617
    Shell Resolution(Low) 1.7977
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 6781
    R-Factor(R-Work) 0.1276
    R-Factor(R-Free) 0.212
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7977
    Shell Resolution(Low) 1.8368
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6806
    R-Factor(R-Work) 0.1189
    R-Factor(R-Free) 0.1644
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8368
    Shell Resolution(Low) 1.8795
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6751
    R-Factor(R-Work) 0.1118
    R-Factor(R-Free) 0.1625
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8795
    Shell Resolution(Low) 1.9265
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 6784
    R-Factor(R-Work) 0.1082
    R-Factor(R-Free) 0.1588
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9265
    Shell Resolution(Low) 1.9786
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 6847
    R-Factor(R-Work) 0.1108
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9786
    Shell Resolution(Low) 2.0368
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6904
    R-Factor(R-Work) 0.1155
    R-Factor(R-Free) 0.1568
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0368
    Shell Resolution(Low) 2.1026
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6976
    R-Factor(R-Work) 0.1155
    R-Factor(R-Free) 0.1454
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1026
    Shell Resolution(Low) 2.1777
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 7067
    R-Factor(R-Work) 0.1186
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1777
    Shell Resolution(Low) 2.2649
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 7117
    R-Factor(R-Work) 0.1191
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2649
    Shell Resolution(Low) 2.3679
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 7059
    R-Factor(R-Work) 0.1245
    R-Factor(R-Free) 0.1659
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3679
    Shell Resolution(Low) 2.4927
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 7134
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4927
    Shell Resolution(Low) 2.6489
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 7093
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6489
    Shell Resolution(Low) 2.8533
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 7109
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.1645
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8533
    Shell Resolution(Low) 3.1403
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 7168
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1403
    Shell Resolution(Low) 3.5944
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 7136
    R-Factor(R-Work) 0.1604
    R-Factor(R-Free) 0.1865
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5944
    Shell Resolution(Low) 4.5271
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 7159
    R-Factor(R-Work) 0.1539
    R-Factor(R-Free) 0.1872
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5271
    Shell Resolution(Low) 35.863
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 7117
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2369
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.08
    f_dihedral_angle_d 14.162
    f_angle_d 1.362
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7955
    Nucleic Acid Atoms 0
    Heterogen Atoms 79
    Solvent Atoms 824
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phenix
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building phenix
    data collection ADSC version: Quantum