X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Evaporation
pH 4.8
Temperature 298.0
Details 12% PEG3350, 0.1M Na acetate, 0.8M NaCl, 2.5mM CaCl2, pH 4.8, EVAPORATION, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 129.87 α = 90
b = 129.87 β = 90
c = 305.9 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2009-02-08
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.0332 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 65 93.0 -- -- -- -- 333510 66702 1.0 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.9 65.0 -- 1.33 67145 62216 2924 92.66 -- 0.1816 0.1791 0.2329 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.9001 2.9477 -- 3 1208 0.3396 0.1623 -- 38.0
X Ray Diffraction 2.9477 2.9985 -- 31 1646 0.3269 0.4037 -- 54.0
X Ray Diffraction 2.9985 3.053 -- 98 2170 0.3009 0.3854 -- 72.0
X Ray Diffraction 3.053 3.1118 -- 115 2651 0.2894 0.3325 -- 87.0
X Ray Diffraction 3.1118 3.1753 -- 141 2865 0.258 0.3077 -- 95.0
X Ray Diffraction 3.1753 3.2443 -- 175 2960 0.2486 0.3066 -- 99.0
X Ray Diffraction 3.2443 3.3198 -- 166 2979 0.237 0.2504 -- 100.0
X Ray Diffraction 3.3198 3.4028 -- 147 3034 0.2261 0.2746 -- 100.0
X Ray Diffraction 3.4028 3.4948 -- 152 2983 0.2154 0.2792 -- 100.0
X Ray Diffraction 3.4948 3.5976 -- 169 3007 0.1976 0.2709 -- 100.0
X Ray Diffraction 3.5976 3.7137 -- 137 3030 0.1814 0.2519 -- 100.0
X Ray Diffraction 3.7137 3.8465 -- 130 3015 0.1668 0.2001 -- 100.0
X Ray Diffraction 3.8465 4.0004 -- 167 3059 0.1578 0.2228 -- 100.0
X Ray Diffraction 4.0004 4.1825 -- 153 3048 0.148 0.1886 -- 100.0
X Ray Diffraction 4.1825 4.4029 -- 138 3040 0.1368 0.1859 -- 100.0
X Ray Diffraction 4.4029 4.6787 -- 173 3031 0.1262 0.1817 -- 100.0
X Ray Diffraction 4.6787 5.0398 -- 175 3034 0.1301 0.1799 -- 100.0
X Ray Diffraction 5.0398 5.5468 -- 185 3037 0.1489 0.2157 -- 100.0
X Ray Diffraction 5.5468 6.3488 -- 160 3087 0.1803 0.2345 -- 100.0
X Ray Diffraction 6.3488 7.9965 -- 168 3132 0.1936 0.2934 -- 100.0
X Ray Diffraction 7.9965 64.9513 -- 141 3276 0.1908 0.2438 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -7.0391
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -7.0391
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 14.0782
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.049
f_dihedral_angle_d 20.238
f_angle_d 0.734
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 12518
Nucleic Acid Atoms 0
Heterogen Atoms 499
Solvent Atoms 106

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
DENZO Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
CNS Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: dev_276) refinement
CNS model building
HKL-2000 data collection