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X-RAY DIFFRACTION
Materials and Methods page
4G1M
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 4.8
    Temperature 298.0
    Details 12% PEG3350, 0.1M Na acetate, 0.8M NaCl, 2.5mM CaCl2, pH 4.8, EVAPORATION, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 129.87 α = 90
    b = 129.87 β = 90
    c = 305.9 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-02-08
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 1.0332
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.9
    Resolution(Low) 65
    Number Reflections(All) 333510
    Number Reflections(Observed) 66702
    Percent Possible(Observed) 93.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.9
    Resolution(Low) 65.0
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 67145
    Number of Reflections(Observed) 62216
    Number of Reflections(R-Free) 2924
    Percent Reflections(Observed) 92.66
    R-Factor(Observed) 0.1816
    R-Work 0.1791
    R-Free 0.2329
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.0391
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -7.0391
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 14.0782
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9001
    Shell Resolution(Low) 2.9477
    Number of Reflections(R-Free) 3
    Number of Reflections(R-Work) 1208
    R-Factor(R-Work) 0.3396
    R-Factor(R-Free) 0.1623
    Percent Reflections(Observed) 38.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9477
    Shell Resolution(Low) 2.9985
    Number of Reflections(R-Free) 31
    Number of Reflections(R-Work) 1646
    R-Factor(R-Work) 0.3269
    R-Factor(R-Free) 0.4037
    Percent Reflections(Observed) 54.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9985
    Shell Resolution(Low) 3.053
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 2170
    R-Factor(R-Work) 0.3009
    R-Factor(R-Free) 0.3854
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.053
    Shell Resolution(Low) 3.1118
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.2894
    R-Factor(R-Free) 0.3325
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1118
    Shell Resolution(Low) 3.1753
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2865
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.3077
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1753
    Shell Resolution(Low) 3.2443
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 2960
    R-Factor(R-Work) 0.2486
    R-Factor(R-Free) 0.3066
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2443
    Shell Resolution(Low) 3.3198
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2979
    R-Factor(R-Work) 0.237
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3198
    Shell Resolution(Low) 3.4028
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3034
    R-Factor(R-Work) 0.2261
    R-Factor(R-Free) 0.2746
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4028
    Shell Resolution(Low) 3.4948
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2983
    R-Factor(R-Work) 0.2154
    R-Factor(R-Free) 0.2792
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4948
    Shell Resolution(Low) 3.5976
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3007
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5976
    Shell Resolution(Low) 3.7137
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3030
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2519
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7137
    Shell Resolution(Low) 3.8465
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 3015
    R-Factor(R-Work) 0.1668
    R-Factor(R-Free) 0.2001
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8465
    Shell Resolution(Low) 4.0004
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3059
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0004
    Shell Resolution(Low) 4.1825
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3048
    R-Factor(R-Work) 0.148
    R-Factor(R-Free) 0.1886
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1825
    Shell Resolution(Low) 4.4029
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3040
    R-Factor(R-Work) 0.1368
    R-Factor(R-Free) 0.1859
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4029
    Shell Resolution(Low) 4.6787
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3031
    R-Factor(R-Work) 0.1262
    R-Factor(R-Free) 0.1817
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6787
    Shell Resolution(Low) 5.0398
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3034
    R-Factor(R-Work) 0.1301
    R-Factor(R-Free) 0.1799
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0398
    Shell Resolution(Low) 5.5468
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3037
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5468
    Shell Resolution(Low) 6.3488
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3087
    R-Factor(R-Work) 0.1803
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3488
    Shell Resolution(Low) 7.9965
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3132
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2934
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.9965
    Shell Resolution(Low) 64.9513
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3276
    R-Factor(R-Work) 0.1908
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.049
    f_dihedral_angle_d 20.238
    f_angle_d 0.734
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12518
    Nucleic Acid Atoms 0
    Heterogen Atoms 499
    Solvent Atoms 106
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_276)
    model building CNS
    data collection HKL-2000