X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 38.98 α = 87.31
b = 48.47 β = 76.85
c = 59.37 γ = 72.64
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2010-11-20
Diffraction Radiation
Monochromator Protocol
DOUBLE FLAT CRYSTAL, SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.1159 ALS 8.3.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 46.25 -- -- -- -- -- -- 31194 -- -- 20.56

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.75 46.25 -- 0.16 -- 31194 1486 77.0 -- 0.173 0.172 0.202 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.75 1.8159 -- 49 805 0.2162 0.2897 -- 21.0
X Ray Diffraction 1.8159 1.8886 -- 70 1320 0.1906 0.207 -- 35.0
X Ray Diffraction 1.8886 1.9745 -- 94 2075 0.193 0.2441 -- 53.0
X Ray Diffraction 1.9745 2.0786 -- 163 3246 0.1762 0.2388 -- 84.0
X Ray Diffraction 2.0786 2.2089 -- 182 3611 0.1711 0.2008 -- 93.0
X Ray Diffraction 2.2089 2.3794 -- 182 3644 0.1735 0.2218 -- 94.0
X Ray Diffraction 2.3794 2.6189 -- 187 3697 0.183 0.2453 -- 96.0
X Ray Diffraction 2.6189 2.9977 -- 187 3759 0.1863 0.2043 -- 97.0
X Ray Diffraction 2.9977 3.7766 -- 186 3744 0.1671 0.1834 -- 98.0
X Ray Diffraction 3.7766 46.25 -- 186 3807 0.1585 0.1805 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 28.58
Anisotropic B[1][1] -7.6185
Anisotropic B[1][2] -2.815
Anisotropic B[1][3] 0.2164
Anisotropic B[2][2] 0.1292
Anisotropic B[2][3] 7.1253
Anisotropic B[3][3] 7.4892
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.071
f_dihedral_angle_d 12.805
f_angle_d 1.025
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3152
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 350

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX Structure Solution
PHENIX (PHENIX.REFINE: 1.6.4_486) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: 1.6.4_486) refinement
PHENIX model building