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X-RAY DIFFRACTION
Materials and Methods page
4G1J
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 38.98 α = 87.31
    b = 48.47 β = 76.85
    c = 59.37 γ = 72.64
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-11-20
     
    Diffraction Radiation
    Monochromator DOUBLE FLAT CRYSTAL, SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.1159
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.75
    Resolution(Low) 46.25
    Number Reflections(Observed) 31194
    B(Isotropic) From Wilson Plot 20.56
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.75
    Resolution(Low) 46.25
    Cut-off Sigma(F) 0.16
    Number of Reflections(Observed) 31194
    Number of Reflections(R-Free) 1486
    Percent Reflections(Observed) 77.0
    R-Factor(Observed) 0.173
    R-Work 0.172
    R-Free 0.202
     
    Temperature Factor Modeling
    Mean Isotropic B Value 28.58
    Anisotropic B[1][1] -7.6185
    Anisotropic B[1][2] -2.815
    Anisotropic B[1][3] 0.2164
    Anisotropic B[2][2] 0.1292
    Anisotropic B[2][3] 7.1253
    Anisotropic B[3][3] 7.4892
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.75
    Shell Resolution(Low) 1.8159
    Number of Reflections(R-Free) 49
    Number of Reflections(R-Work) 805
    R-Factor(R-Work) 0.2162
    R-Factor(R-Free) 0.2897
    Percent Reflections(Observed) 21.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8159
    Shell Resolution(Low) 1.8886
    Number of Reflections(R-Free) 70
    Number of Reflections(R-Work) 1320
    R-Factor(R-Work) 0.1906
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 35.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8886
    Shell Resolution(Low) 1.9745
    Number of Reflections(R-Free) 94
    Number of Reflections(R-Work) 2075
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9745
    Shell Resolution(Low) 2.0786
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3246
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0786
    Shell Resolution(Low) 2.2089
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3611
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2008
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2089
    Shell Resolution(Low) 2.3794
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3644
    R-Factor(R-Work) 0.1735
    R-Factor(R-Free) 0.2218
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3794
    Shell Resolution(Low) 2.6189
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3697
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2453
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6189
    Shell Resolution(Low) 2.9977
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3759
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2043
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9977
    Shell Resolution(Low) 3.7766
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3744
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7766
    Shell Resolution(Low) 46.25
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3807
    R-Factor(R-Work) 0.1585
    R-Factor(R-Free) 0.1805
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 12.805
    f_angle_d 1.025
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3152
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 350
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6.4_486)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.6.4_486)
    model building PHENIX