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X-RAY DIFFRACTION
Materials and Methods page
4G1H
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.44 α = 90
    b = 60.44 β = 90
    c = 102.24 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-10-18
     
    Diffraction Radiation
    Monochromator DOUBLE FLAT CRYSTAL, SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.115889
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.8
    Resolution(Low) 30.22
    Number Reflections(Observed) 17711
    B(Isotropic) From Wilson Plot 27.14
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 30.22
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 17187
    Number of Reflections(R-Free) 1716
    Percent Reflections(Observed) 94.3
    R-Factor(Observed) 0.216
    R-Work 0.212
    R-Free 0.251
     
    Temperature Factor Modeling
    Mean Isotropic B Value 31.98
    Anisotropic B[1][1] -5.1735
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -5.1735
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 10.347
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.865
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1197
    R-Factor(R-Work) 0.2945
    R-Factor(R-Free) 0.3241
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.865
    Shell Resolution(Low) 1.9397
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1411
    R-Factor(R-Work) 0.2541
    R-Factor(R-Free) 0.2945
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9397
    Shell Resolution(Low) 2.0279
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1477
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.291
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0279
    Shell Resolution(Low) 2.1348
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 1535
    R-Factor(R-Work) 0.2292
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1348
    Shell Resolution(Low) 2.2685
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 1571
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.293
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2685
    Shell Resolution(Low) 2.4436
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 1589
    R-Factor(R-Work) 0.2191
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4436
    Shell Resolution(Low) 2.6894
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 1622
    R-Factor(R-Work) 0.2291
    R-Factor(R-Free) 0.3073
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6894
    Shell Resolution(Low) 3.0782
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 1642
    R-Factor(R-Work) 0.2373
    R-Factor(R-Free) 0.2761
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0782
    Shell Resolution(Low) 3.877
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 1668
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2372
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.877
    Shell Resolution(Low) 30.22
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1759
    R-Factor(R-Work) 0.1827
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 11.595
    f_angle_d 1.088
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1364
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 91
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6.4_486)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.6.4_486)