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X-RAY DIFFRACTION
Materials and Methods page
4G1E
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 5.8
    Temperature 293.0
    Details 2.0M ammonium sulfate, 80mM sodium cacodylate, 6mM Magnesium Chloride, 2mM Calcium Chloride, pH 5.8, EVAPORATION, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 128.56 α = 90
    b = 128.56 β = 90
    c = 352.86 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.000
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(All) 591720
    Number Reflections(Observed) 79656
    Percent Possible(Observed) 99.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 47.521
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 452576
    Number of Reflections(Observed) 79656
    Number of Reflections(R-Free) 1168
    Percent Reflections(Observed) 99.96
    R-Factor(Observed) 0.2423
    R-Work 0.2409
    R-Free 0.2608
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.0163
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.0163
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.0325
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8526
    Shell Resolution(Low) 2.9823
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 9647
    R-Factor(R-Work) 0.357
    R-Factor(R-Free) 0.3803
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9823
    Shell Resolution(Low) 3.1395
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 9688
    R-Factor(R-Work) 0.3282
    R-Factor(R-Free) 0.3694
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1395
    Shell Resolution(Low) 3.336
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 9660
    R-Factor(R-Work) 0.3088
    R-Factor(R-Free) 0.3361
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.336
    Shell Resolution(Low) 3.5933
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 9756
    R-Factor(R-Work) 0.275
    R-Factor(R-Free) 0.2929
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5933
    Shell Resolution(Low) 3.9544
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 9730
    R-Factor(R-Work) 0.2561
    R-Factor(R-Free) 0.2923
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9544
    Shell Resolution(Low) 4.5254
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 9812
    R-Factor(R-Work) 0.2197
    R-Factor(R-Free) 0.2225
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5254
    Shell Resolution(Low) 5.6971
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 9885
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2087
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6971
    Shell Resolution(Low) 33.6393
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 10243
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.241
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.05
    f_dihedral_angle_d 20.153
    f_angle_d 0.751
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12966
    Nucleic Acid Atoms 0
    Heterogen Atoms 667
    Solvent Atoms 99
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection HKL-2000