POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4G0R
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details The reservoir solution contained 1-3% (w/v) polyethylene glycol 8000 (PEG 8000), 150 mM NaCl, and 8mM CaCl2.2H2O as precipitants in 10 mM Tris. The drops were prepared by mixing equivolume of virus solution (10mg/ml) in Tris-HCl Buffer (10 mM Tris-HCl, 150 mM NaCl, 8mM CaCl2.2H2O) with reservoir solution, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 255.4 α = 90
    b = 350.4 β = 90.34
    c = 271.6 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 277
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Details mirror
    Collection Date 2010-06-04
     
    Diffraction Radiation
    Monochromator Horizontal bent Si(111), asymmetrically cut with water cooled Cu Block
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.9186
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.7
    Resolution(Low) 50
    Number Reflections(All) 1210268
    Number Reflections(Observed) 1127217
    Percent Possible(Observed) 93.1
    Redundancy 2.6
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.8
    Percent Possible(All) 94.7
    Mean I Over Sigma(Observed) 2.4
    R-Sym I(Observed) 0.378
    Redundancy 2.4
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.7
    Resolution(Low) 50.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(R-Free) 56289
    Percent Reflections(Observed) 86.7
    R-Work 0.216
    R-Free 0.2169
     
    Temperature Factor Modeling
    Mean Isotropic B Value 33.126
    Anisotropic B[1][1] -3.118
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.62
    Anisotropic B[2][2] 1.979
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.139
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7
    Shell Resolution(Low) 2.8
    Number of Reflections(R-Free) 5282
    Number of Reflections(R-Work) 98565
    R-Factor(R-Work) 0.31
    R-Factor(R-Free) 0.3111
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8
    Shell Resolution(Low) 2.91
    Number of Reflections(R-Free) 5453
    Number of Reflections(R-Work) 101647
    R-Factor(R-Work) 0.2918
    R-Factor(R-Free) 0.2897
    Percent Reflections(Observed) 82.5
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.91
    Shell Resolution(Low) 3.04
    Number of Reflections(R-Free) 5444
    Number of Reflections(R-Work) 104633
    R-Factor(R-Work) 0.2751
    R-Factor(R-Free) 0.2754
    Percent Reflections(Observed) 84.7
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.04
    Shell Resolution(Low) 3.2
    Number of Reflections(R-Free) 5696
    Number of Reflections(R-Work) 106124
    R-Factor(R-Work) 0.2593
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 86.2
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2
    Shell Resolution(Low) 3.4
    Number of Reflections(R-Free) 5762
    Number of Reflections(R-Work) 108528
    R-Factor(R-Work) 0.2373
    R-Factor(R-Free) 0.2387
    Percent Reflections(Observed) 87.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4
    Shell Resolution(Low) 3.66
    Number of Reflections(R-Free) 5688
    Number of Reflections(R-Work) 110042
    R-Factor(R-Work) 0.223
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 89.1
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.66
    Shell Resolution(Low) 4.03
    Number of Reflections(R-Free) 5750
    Number of Reflections(R-Work) 110445
    R-Factor(R-Work) 0.2059
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 89.4
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.03
    Shell Resolution(Low) 4.62
    Number of Reflections(R-Free) 5777
    Number of Reflections(R-Work) 112038
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.17
    Percent Reflections(Observed) 90.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.62
    Shell Resolution(Low) 5.81
    Number of Reflections(R-Free) 5859
    Number of Reflections(R-Work) 110819
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.1678
    Percent Reflections(Observed) 89.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.81
    Shell Resolution(Low) 50.0
    Number of Reflections(R-Free) 5578
    Number of Reflections(R-Work) 108087
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 86.8
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 3.164
    c_mcangle_it 1.991
    c_scbond_it 2.036
    c_mcbond_it 1.141
    c_angle_d 1.365
    c_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4375
    Nucleic Acid Atoms 194
    Heterogen Atoms 40
    Solvent Atoms 131
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution AMoRE
    Structure Refinement CNS 1.3
     
    Software
    refinement CNS version: 1.3
    model building AMoRE
    data collection HKL-2000