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X-RAY DIFFRACTION
Materials and Methods page
4G0N
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.8
    Temperature 291.0
    Details Protein solution: 10 - 16 mg/mL, 50 mM HEPES, pH 7.2, 50 mM NaCl, 10mM MgCl2 5% Glycerol, 1mM DTE, 10 M ZnCl2 Reservoir solution:200mM calcium acetate, 100mM sodium cacodylate pH 6.5, 18% PEG 8000. Drop: 1uL protein, 1uL reservoir, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 90.44 α = 90
    b = 90.44 β = 90
    c = 92.7 γ = 120
     
    Space Group
    Space Group Name:    P 3 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
     
    Diffraction Radiation
    Monochromator crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-D
    Wavelength List 1.0
    Site APS
    Beamline 23-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 3.0
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 2.45
    Resolution(Low) 32.4
    Number Reflections(All) 16218
    Number Reflections(Observed) 16218
    R Merge I(Observed) 0.15
    Redundancy 8.9
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 2.45
    Resolution(Low) 32.368
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 16133
    Number of Reflections(R-Free) 1628
    Percent Reflections(Observed) 97.08
    R-Factor(Observed) 0.1858
    R-Work 0.1809
    R-Free 0.2294
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 7.1703
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 7.1703
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -14.3406
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4459
    Shell Resolution(Low) 2.5178
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 930
    R-Factor(R-Work) 0.2724
    R-Factor(R-Free) 0.2884
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5178
    Shell Resolution(Low) 2.5991
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 1138
    R-Factor(R-Work) 0.2444
    R-Factor(R-Free) 0.2859
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5991
    Shell Resolution(Low) 2.6919
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1194
    R-Factor(R-Work) 0.2416
    R-Factor(R-Free) 0.315
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6919
    Shell Resolution(Low) 2.7996
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1225
    R-Factor(R-Work) 0.2275
    R-Factor(R-Free) 0.2771
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7996
    Shell Resolution(Low) 2.927
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1212
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.927
    Shell Resolution(Low) 3.0812
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1238
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.278
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0812
    Shell Resolution(Low) 3.274
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1223
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.274
    Shell Resolution(Low) 3.5266
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1234
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2133
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5266
    Shell Resolution(Low) 3.8809
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1244
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.2208
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8809
    Shell Resolution(Low) 4.4413
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1255
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1776
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4413
    Shell Resolution(Low) 5.5908
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1279
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5908
    Shell Resolution(Low) 32.3708
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1333
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.04
    f_dihedral_angle_d 14.171
    f_angle_d 0.68
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1875
    Nucleic Acid Atoms 0
    Heterogen Atoms 47
    Solvent Atoms 82
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8.2_1309)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX