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X-RAY DIFFRACTION
Materials and Methods page
4FZ4
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 7.5
    Temperature 293.0
    Details 30% PEG 3350, 0.4M NaNO3 , pH 7.5, EVAPORATION, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.24 α = 90
    b = 87.6 β = 90
    c = 38.54 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 298
     
    Diffraction Detector
    Detector CCD
    Type MAR555 FLAT PANEL
    Collection Date 2008-11-20
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9795
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.44
    Resolution(Low) 50
    Number Reflections(All) 7687
    Number Reflections(Observed) 6551
    Percent Possible(Observed) 85.2
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.49
    Percent Possible(All) 97.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.44
    Resolution(Low) 18.82
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 7687
    Number of Reflections(Observed) 6551
    Number of Reflections(R-Free) 336
    R-Factor(All) 0.263
    R-Factor(Observed) 0.222
    R-Work 0.222
    R-Free 0.263
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 47.1
    Anisotropic B[1][1] -0.85
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.73
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.88
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.44
    Shell Resolution(Low) 2.59
    Number of Reflections(R-Free) 56
    Number of Reflections(R-Work) 993
    R-Factor(R-Work) 0.273
    R-Factor(R-Free) 0.318
    R-Free Error 0.043
    Percent Reflections(Observed) 96.4
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 11.74
    c_scbond_it 8.46
    c_mcangle_it 8.08
    c_mcbond_it 5.72
    c_improper_angle_d 0.67
    c_dihedral_angle_d 17.9
    c_angle_deg 1.1
    c_bond_d 0.006
     
    Coordinate Error
    Luzzati ESD(Observed) 0.31
    Luzzati Sigma A(Observed) 0.25
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.39
    Luzzati Sigma A(R-Free Set) 0.28
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1267
    Nucleic Acid Atoms 0
    Heterogen Atoms 6
    Solvent Atoms 31
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement CNS 1.2
     
    Software
    refinement CNS version: 1.2
    model building PHENIX
    data collection MAR345dtb