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X-RAY DIFFRACTION
Materials and Methods page
4FXW
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 277.0
    Details 0.2 M Lithium sulfate, 20% PEG 3350 and 0.1 M Tris pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 76.8 α = 90
    b = 116.1 β = 90
    c = 130 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 325 mm CCD
    Collection Date 2011-05-19
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL9-2
    Wavelength List 0.9219, 0.9794, 0.9793
    Site SSRL
    Beamline BL9-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.29
    Resolution(Low) 50
    Number Reflections(Observed) 50161
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.062
    Redundancy 4.4
     
    High Resolution Shell Details
    Resolution(High) 2.29
    Resolution(Low) 2.33
    Percent Possible(All) 99.7
    R Merge I(Observed) 0.619
    Redundancy 3.0
    Number Unique Reflections(All) 2689
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.29
    Resolution(Low) 34.56
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 45220
    Number of Reflections(R-Free) 3951
    Percent Reflections(Observed) 89.42
    R-Factor(Observed) 0.2513
    R-Work 0.2484
    R-Free 0.2807
     
    Temperature Factor Modeling
    Mean Isotropic B Value 105.056
    Anisotropic B[1][1] 47.6199
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -27.4242
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -20.1957
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.29
    Shell Resolution(Low) 2.3179
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 1175
    R-Factor(R-Work) 0.4348
    R-Factor(R-Free) 0.4604
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3179
    Shell Resolution(Low) 2.3473
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 1200
    R-Factor(R-Work) 0.4443
    R-Factor(R-Free) 0.4977
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3473
    Shell Resolution(Low) 2.3782
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 1271
    R-Factor(R-Work) 0.4157
    R-Factor(R-Free) 0.4161
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3782
    Shell Resolution(Low) 2.4107
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 1287
    R-Factor(R-Work) 0.4355
    R-Factor(R-Free) 0.4054
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4107
    Shell Resolution(Low) 2.4452
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 1264
    R-Factor(R-Work) 0.4091
    R-Factor(R-Free) 0.4168
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4452
    Shell Resolution(Low) 2.4817
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 1291
    R-Factor(R-Work) 0.3728
    R-Factor(R-Free) 0.4042
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4817
    Shell Resolution(Low) 2.5204
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1371
    R-Factor(R-Work) 0.4195
    R-Factor(R-Free) 0.3689
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5204
    Shell Resolution(Low) 2.5617
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 1360
    R-Factor(R-Work) 0.367
    R-Factor(R-Free) 0.3713
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5617
    Shell Resolution(Low) 2.6059
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1356
    R-Factor(R-Work) 0.3775
    R-Factor(R-Free) 0.4716
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6059
    Shell Resolution(Low) 2.6533
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1395
    R-Factor(R-Work) 0.3863
    R-Factor(R-Free) 0.4963
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6533
    Shell Resolution(Low) 2.7043
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1379
    R-Factor(R-Work) 0.3612
    R-Factor(R-Free) 0.3554
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7043
    Shell Resolution(Low) 2.7594
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1432
    R-Factor(R-Work) 0.3613
    R-Factor(R-Free) 0.3035
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7594
    Shell Resolution(Low) 2.8194
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1489
    R-Factor(R-Work) 0.3578
    R-Factor(R-Free) 0.4337
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8194
    Shell Resolution(Low) 2.885
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1511
    R-Factor(R-Work) 0.3551
    R-Factor(R-Free) 0.3576
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.885
    Shell Resolution(Low) 2.9571
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1519
    R-Factor(R-Work) 0.3285
    R-Factor(R-Free) 0.3429
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9571
    Shell Resolution(Low) 3.037
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1557
    R-Factor(R-Work) 0.3251
    R-Factor(R-Free) 0.2887
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.037
    Shell Resolution(Low) 3.1263
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1584
    R-Factor(R-Work) 0.3364
    R-Factor(R-Free) 0.3789
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1263
    Shell Resolution(Low) 3.2271
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1615
    R-Factor(R-Work) 0.3275
    R-Factor(R-Free) 0.4468
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2271
    Shell Resolution(Low) 3.3424
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1625
    R-Factor(R-Work) 0.2986
    R-Factor(R-Free) 0.3408
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3424
    Shell Resolution(Low) 3.4761
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1609
    R-Factor(R-Work) 0.2799
    R-Factor(R-Free) 0.3375
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4761
    Shell Resolution(Low) 3.6341
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1613
    R-Factor(R-Work) 0.2534
    R-Factor(R-Free) 0.2469
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6341
    Shell Resolution(Low) 3.8255
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1609
    R-Factor(R-Work) 0.2428
    R-Factor(R-Free) 0.3013
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8255
    Shell Resolution(Low) 4.0648
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1660
    R-Factor(R-Work) 0.2273
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0648
    Shell Resolution(Low) 4.3781
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1616
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2482
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3781
    Shell Resolution(Low) 4.8177
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1638
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1884
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8177
    Shell Resolution(Low) 5.5124
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1651
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.1882
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5124
    Shell Resolution(Low) 6.9358
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1654
    R-Factor(R-Work) 0.2162
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.9358
    Shell Resolution(Low) 34.5641
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1538
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2517
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.263
    f_plane_restr 0.004
    f_chiral_restr 0.044
    f_angle_d 0.656
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3273
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 56
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Webice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL