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X-RAY DIFFRACTION
Materials and Methods page
4FXD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 291.0
    Details 0.1 M Bicine, 12% PEG3350, 10 mM MgCl2, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.14 α = 82.26
    b = 74.77 β = 72.57
    c = 116.99 γ = 82.4
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2009-12-11
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength List 0.93340
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3
    Resolution(Low) 58.77
    Number Reflections(All) 45027
    Number Reflections(Observed) 45027
    Percent Possible(Observed) 97.8
    R Merge I(Observed) 0.073
    B(Isotropic) From Wilson Plot 91.64
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.16
    Percent Possible(All) 97.5
    R Merge I(Observed) 0.921
    Mean I Over Sigma(Observed) 1.5
    R-Sym I(Observed) 0.921
    Redundancy 3.9
    Number Unique Reflections(All) 6546
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 55.526
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 45009
    Number of Reflections(Observed) 45009
    Number of Reflections(R-Free) 2264
    Percent Reflections(Observed) 97.79
    R-Factor(Observed) 0.2555
    R-Work 0.2539
    R-Free 0.2848
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.0652
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.3691
    R-Factor(R-Free) 0.4168
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0652
    Shell Resolution(Low) 3.1365
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.3456
    R-Factor(R-Free) 0.3415
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1365
    Shell Resolution(Low) 3.215
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.3264
    R-Factor(R-Free) 0.3823
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.215
    Shell Resolution(Low) 3.3019
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.322
    R-Factor(R-Free) 0.377
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3019
    Shell Resolution(Low) 3.399
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.3066
    R-Factor(R-Free) 0.3249
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.399
    Shell Resolution(Low) 3.5087
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.3036
    R-Factor(R-Free) 0.3577
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5087
    Shell Resolution(Low) 3.6341
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.3013
    R-Factor(R-Free) 0.3628
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6341
    Shell Resolution(Low) 3.7796
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.3004
    R-Factor(R-Free) 0.3258
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7796
    Shell Resolution(Low) 3.9515
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.2824
    R-Factor(R-Free) 0.3522
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9515
    Shell Resolution(Low) 4.1598
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.275
    R-Factor(R-Free) 0.3064
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1598
    Shell Resolution(Low) 4.4203
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.249
    R-Factor(R-Free) 0.3041
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4203
    Shell Resolution(Low) 4.7615
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2301
    R-Factor(R-Free) 0.2591
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7615
    Shell Resolution(Low) 5.2403
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.2298
    R-Factor(R-Free) 0.2289
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2403
    Shell Resolution(Low) 5.9978
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.24
    R-Factor(R-Free) 0.3015
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9978
    Shell Resolution(Low) 7.5536
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.2451
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.5536
    Shell Resolution(Low) 55.5359
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2163
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.047
    f_dihedral_angle_d 13.545
    f_angle_d 0.766
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13238
    Nucleic Acid Atoms 672
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1078)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1078)
    model building PHASER
    data collection ADSC version: Quantum