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X-RAY DIFFRACTION
Materials and Methods page
4FX6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 1.0 Sodium citrate, 0.1M cacodylate, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55.08 α = 90
    b = 66.4 β = 101.85
    c = 59.55 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-06-08
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.53
    Resolution(Low) 44.38
    Number Reflections(All) 62002
    Number Reflections(Observed) 62002
    Percent Possible(Observed) 97.99
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.531
    Resolution(Low) 44.38
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 62002
    Number of Reflections(Observed) 62002
    Number of Reflections(R-Free) 3157
    Percent Reflections(Observed) 97.99
    R-Factor(Observed) 0.1473
    R-Work 0.146
    R-Free 0.1716
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.531
    Shell Resolution(Low) 1.5539
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2330
    R-Factor(R-Work) 0.1903
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5539
    Shell Resolution(Low) 1.5782
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.186
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5782
    Shell Resolution(Low) 1.604
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.1779
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.604
    Shell Resolution(Low) 1.6317
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.1951
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6317
    Shell Resolution(Low) 1.6614
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6614
    Shell Resolution(Low) 1.6933
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.2261
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6933
    Shell Resolution(Low) 1.7279
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2526
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.1969
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7279
    Shell Resolution(Low) 1.7655
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.1449
    R-Factor(R-Free) 0.1785
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7655
    Shell Resolution(Low) 1.8065
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.1481
    R-Factor(R-Free) 0.1763
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8065
    Shell Resolution(Low) 1.8517
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.179
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8517
    Shell Resolution(Low) 1.9018
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2493
    R-Factor(R-Work) 0.1504
    R-Factor(R-Free) 0.189
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9018
    Shell Resolution(Low) 1.9577
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.1766
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9577
    Shell Resolution(Low) 2.0209
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1385
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0209
    Shell Resolution(Low) 2.0932
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.1441
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0932
    Shell Resolution(Low) 2.177
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.1379
    R-Factor(R-Free) 0.1517
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.177
    Shell Resolution(Low) 2.276
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1398
    R-Factor(R-Free) 0.1815
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.276
    Shell Resolution(Low) 2.396
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.1463
    R-Factor(R-Free) 0.1621
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.396
    Shell Resolution(Low) 2.5461
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.1502
    R-Factor(R-Free) 0.1687
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5461
    Shell Resolution(Low) 2.7427
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.1899
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7427
    Shell Resolution(Low) 3.0187
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1557
    R-Factor(R-Free) 0.1711
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0187
    Shell Resolution(Low) 3.4553
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1589
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4553
    Shell Resolution(Low) 4.3527
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1225
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3527
    Shell Resolution(Low) 44.3984
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.1498
    R-Factor(R-Free) 0.1643
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.076
    f_dihedral_angle_d 12.465
    f_angle_d 1.111
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3358
    Nucleic Acid Atoms 0
    Heterogen Atoms 68
    Solvent Atoms 373
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHENIX
    data collection CBASS