X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 11
Temperature 291.0
Details 4%(v/v) 2-propanol, 0.05M capso, 12.25%(w/v) PEG MME5000, 12.5% glycerol, pH 11.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 64.25 α = 90
b = 64.25 β = 90
c = 320.61 γ = 90
Symmetry
Space Group P 43 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2010-11-06
Diffraction Radiation
Monochromator Protocol
Mirror SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9793 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.89 50 97.5 -- -- -- -- -- 15715 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.89 2.99 90.3 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.892 41.809 -- 0.0 15549 14810 739 92.36 -- 0.2146 0.2119 0.2679 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8919 3.1151 -- 136 2351 0.3439 0.4282 -- 80.0
X Ray Diffraction 3.1151 3.4284 -- 127 2620 0.2532 0.2998 -- 88.0
X Ray Diffraction 3.4284 3.9242 -- 165 2848 0.1923 0.2684 -- 95.0
X Ray Diffraction 3.9242 4.9428 -- 152 3018 0.1681 0.2082 -- 98.0
X Ray Diffraction 4.9428 41.8131 -- 159 3234 0.2193 0.273 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 68.6704
Anisotropic B[1][1] 6.8956
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 6.8956
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -13.7912
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 20.334
f_plane_restr 0.005
f_chiral_restr 0.085
f_angle_d 1.477
f_bond_d 0.015
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2425
Nucleic Acid Atoms 0
Heterogen Atoms 40
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHELXS Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7_650) refinement
SHELXS model building
HKL-2000 data collection