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X-RAY DIFFRACTION
Materials and Methods page
4FSL
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 6.2
    Temperature 298.0
    Details 35% PEG8K, 0.2 M ammonium sulfate, pH 6.2, vapor diffusion, hanging drop, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 86.54 α = 90
    b = 131.18 β = 97.61
    c = 90.32 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 92
    Details MICROMAX CONFOCAL
    Collection Date 2005-04-29
     
    Diffraction Radiation
    Diffraction Protocol None
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU
    Wavelength 1.54000
    Wavelength List 1.541
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(Observed) 66645
    Percent Possible(Observed) 96.8
    R Merge I(Observed) 0.087
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.59
    Percent Possible(All) 91.1
    R Merge I(Observed) 0.472
    Redundancy 3.2
    Number Unique Reflections(All) 6244
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 50.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 66542
    Number of Reflections(R-Free) 3377
    Percent Reflections(Observed) 96.54
    R-Factor(Observed) 0.2265
    R-Work 0.2239
    R-Free 0.277
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 26.3625
    Anisotropic B[1][1] -2.52
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.52
    Anisotropic B[2][2] -1.86
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.51
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.502
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 4284
    R-Factor(R-Work) 0.297
    R-Factor(R-Free) 0.359
    Percent Reflections(Observed) 88.77
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 1.073
    r_scbond_it 0.623
    r_mcangle_it 0.589
    r_mcbond_it 0.318
    r_symmetry_hbond_refined 0.099
    r_bond_refined_d 0.007
    r_angle_refined_deg 1.154
    r_dihedral_angle_1_deg 5.612
    r_dihedral_angle_2_deg 36.086
    r_dihedral_angle_3_deg 14.724
    r_dihedral_angle_4_deg 14.327
    r_chiral_restr 0.069
    r_gen_planes_refined 0.003
    r_nbd_refined 0.179
    r_nbtor_refined 0.305
    r_xyhbond_nbd_refined 0.125
    r_symmetry_vdw_refined 0.222
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12156
    Nucleic Acid Atoms 0
    Heterogen Atoms 144
    Solvent Atoms 819
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution CNS
    Structure Refinement REFMAC 5.2.0019
     
    Software
    data extraction pdb_extract version: 3.11
    refinement REFMAC5 version: 5.2.0019
    molecular replacement CNS
    data reduction HKL
    data collection DENZO