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X-RAY DIFFRACTION
Materials and Methods page
4FRV
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.2
    Details 0.1M MES, 10mM ZnCl2, 10% glycerol, 28% PEG MME 550, pH 7.2, VAPOR DIFFUSION, HANGING DROP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.79 α = 90
    b = 44.16 β = 95.45
    c = 60.11 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type NOIR-1
    Details Rosenbaum-Rock monochromator 1: high-resolution double-crystal sagittal focusing, Rosenbaum-Rock monochromator 2: double crystal, Rosenbaum-Rock vertical focusing mirror
    Collection Date 2010-08-12
     
    Diffraction Radiation
    Monochromator double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 0.827
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.1
    Resolution(Low) 16.29
    Number Reflections(All) 68567
    Number Reflections(Observed) 61849
    Percent Possible(Observed) 90.2
    R Merge I(Observed) 0.052
    B(Isotropic) From Wilson Plot 4.4
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 1.1
    Resolution(Low) 1.16
    Percent Possible(All) 53.4
    R Merge I(Observed) 0.242
    Mean I Over Sigma(Observed) 4.2
    Redundancy 2.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.1
    Resolution(Low) 16.286
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 68612
    Number of Reflections(Observed) 61728
    Number of Reflections(R-Free) 3083
    Percent Reflections(Observed) 89.97
    R-Factor(Observed) 0.1204
    R-Work 0.1194
    R-Free 0.138
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1
    Shell Resolution(Low) 1.1172
    Number of Reflections(R-Free) 76
    Number of Reflections(R-Work) 1311
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.1902
    Percent Reflections(Observed) 44.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1172
    Shell Resolution(Low) 1.1355
    Number of Reflections(R-Free) 84
    Number of Reflections(R-Work) 1464
    R-Factor(R-Work) 0.1788
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1355
    Shell Resolution(Low) 1.1551
    Number of Reflections(R-Free) 69
    Number of Reflections(R-Work) 1806
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.1722
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1551
    Shell Resolution(Low) 1.1761
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 1976
    R-Factor(R-Work) 0.1618
    R-Factor(R-Free) 0.1557
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1761
    Shell Resolution(Low) 1.1987
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2340
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1987
    Shell Resolution(Low) 1.2231
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.1639
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2231
    Shell Resolution(Low) 1.2497
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1239
    R-Factor(R-Free) 0.1592
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2497
    Shell Resolution(Low) 1.2788
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2942
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.1405
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2788
    Shell Resolution(Low) 1.3108
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2939
    R-Factor(R-Work) 0.1018
    R-Factor(R-Free) 0.1433
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3108
    Shell Resolution(Low) 1.3462
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2964
    R-Factor(R-Work) 0.0964
    R-Factor(R-Free) 0.1539
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3462
    Shell Resolution(Low) 1.3858
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.0951
    R-Factor(R-Free) 0.1107
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3858
    Shell Resolution(Low) 1.4305
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 2917
    R-Factor(R-Work) 0.0913
    R-Factor(R-Free) 0.1305
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4305
    Shell Resolution(Low) 1.4816
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2938
    R-Factor(R-Work) 0.0944
    R-Factor(R-Free) 0.1299
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4816
    Shell Resolution(Low) 1.5409
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2976
    R-Factor(R-Work) 0.0919
    R-Factor(R-Free) 0.1196
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5409
    Shell Resolution(Low) 1.6109
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2959
    R-Factor(R-Work) 0.095
    R-Factor(R-Free) 0.1246
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6109
    Shell Resolution(Low) 1.6958
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2979
    R-Factor(R-Work) 0.0977
    R-Factor(R-Free) 0.1158
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6958
    Shell Resolution(Low) 1.8019
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2941
    R-Factor(R-Work) 0.103
    R-Factor(R-Free) 0.136
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8019
    Shell Resolution(Low) 1.9408
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2972
    R-Factor(R-Work) 0.1059
    R-Factor(R-Free) 0.1234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9408
    Shell Resolution(Low) 2.1357
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2962
    R-Factor(R-Work) 0.1027
    R-Factor(R-Free) 0.1391
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1357
    Shell Resolution(Low) 2.4439
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3008
    R-Factor(R-Work) 0.1143
    R-Factor(R-Free) 0.1068
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4439
    Shell Resolution(Low) 3.0756
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 2965
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.1511
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0756
    Shell Resolution(Low) 16.2874
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3074
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.1447
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.074
    f_dihedral_angle_d 11.606
    f_angle_d 1.286
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1438
    Nucleic Acid Atoms 0
    Heterogen Atoms 17
    Solvent Atoms 276
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Controls: EPICS, GUI: BLU-ICE
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building AMoRE
    data collection GUI: version: BLU-ICE
    data collection Controls: version: EPICS