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X-RAY DIFFRACTION
Materials and Methods page
4FRU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.2
    Temperature 295.0
    Details 0.1M MES, 10mM ZnCl2, 10% glycerol, 28% PEG MME 550, pH 7.2, VAPOR DIFFUSION, HANGING DROP, temperature 295.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 64.88 α = 90
    b = 44.07 β = 95.2
    c = 60.57 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type NOIR-1
    Details Rosenbaum-Rock monochromator 1: high-resolution double-crystal sagittal focusing, Rosenbaum-Rock monochromator 2: double crystal, Rosenbaum-Rock vertical focusing mirror
    Collection Date 2010-08-12
     
    Diffraction Radiation
    Monochromator double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 4.2.2
    Wavelength List 0.827
    Site ALS
    Beamline 4.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.1
    Resolution(Low) 16.42
    Number Reflections(All) 69023
    Number Reflections(Observed) 62397
    Percent Possible(Observed) 90.4
    R Merge I(Observed) 0.078
    B(Isotropic) From Wilson Plot 4.2
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 1.1
    Resolution(Low) 1.16
    Percent Possible(All) 53.4
    R Merge I(Observed) 0.272
    Mean I Over Sigma(Observed) 3.9
    Redundancy 2.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.1
    Resolution(Low) 16.416
    Cut-off Sigma(F) 1.37
    Number of Reflections(all) 69108
    Number of Reflections(Observed) 62351
    Number of Reflections(R-Free) 3161
    Percent Reflections(Observed) 90.22
    R-Factor(Observed) 0.1167
    R-Work 0.1155
    R-Free 0.1391
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1
    Shell Resolution(Low) 1.1164
    Number of Reflections(R-Free) 56
    Number of Reflections(R-Work) 1248
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.1861
    Percent Reflections(Observed) 43.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1164
    Shell Resolution(Low) 1.1339
    Number of Reflections(R-Free) 81
    Number of Reflections(R-Work) 1449
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 52.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1339
    Shell Resolution(Low) 1.1524
    Number of Reflections(R-Free) 92
    Number of Reflections(R-Work) 1695
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.2159
    Percent Reflections(Observed) 59.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1524
    Shell Resolution(Low) 1.1723
    Number of Reflections(R-Free) 95
    Number of Reflections(R-Work) 1897
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.2102
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1723
    Shell Resolution(Low) 1.1936
    Number of Reflections(R-Free) 104
    Number of Reflections(R-Work) 2212
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.1925
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1936
    Shell Resolution(Low) 1.2166
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2410
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.1733
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2166
    Shell Resolution(Low) 1.2414
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.1912
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2414
    Shell Resolution(Low) 1.2684
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.1223
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2684
    Shell Resolution(Low) 1.2979
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2824
    R-Factor(R-Work) 0.1072
    R-Factor(R-Free) 0.1293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2979
    Shell Resolution(Low) 1.3303
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2863
    R-Factor(R-Work) 0.0996
    R-Factor(R-Free) 0.1353
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3303
    Shell Resolution(Low) 1.3663
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2871
    R-Factor(R-Work) 0.097
    R-Factor(R-Free) 0.1294
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3663
    Shell Resolution(Low) 1.4064
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 2815
    R-Factor(R-Work) 0.0913
    R-Factor(R-Free) 0.1182
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4064
    Shell Resolution(Low) 1.4518
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2831
    R-Factor(R-Work) 0.0881
    R-Factor(R-Free) 0.1287
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4518
    Shell Resolution(Low) 1.5037
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2838
    R-Factor(R-Work) 0.0884
    R-Factor(R-Free) 0.1099
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5037
    Shell Resolution(Low) 1.5638
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2846
    R-Factor(R-Work) 0.0856
    R-Factor(R-Free) 0.1285
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5638
    Shell Resolution(Low) 1.6349
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2843
    R-Factor(R-Work) 0.0874
    R-Factor(R-Free) 0.1139
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6349
    Shell Resolution(Low) 1.7211
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2837
    R-Factor(R-Work) 0.0898
    R-Factor(R-Free) 0.1072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7211
    Shell Resolution(Low) 1.8288
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2857
    R-Factor(R-Work) 0.092
    R-Factor(R-Free) 0.1072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8288
    Shell Resolution(Low) 1.9697
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2873
    R-Factor(R-Work) 0.0964
    R-Factor(R-Free) 0.1241
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9697
    Shell Resolution(Low) 2.1676
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2894
    R-Factor(R-Work) 0.098
    R-Factor(R-Free) 0.1152
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1676
    Shell Resolution(Low) 2.4803
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2858
    R-Factor(R-Work) 0.1085
    R-Factor(R-Free) 0.1301
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4803
    Shell Resolution(Low) 3.1214
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2885
    R-Factor(R-Work) 0.1301
    R-Factor(R-Free) 0.1545
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1214
    Shell Resolution(Low) 16.4181
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2958
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.1483
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.078
    f_dihedral_angle_d 11.819
    f_angle_d 1.301
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1429
    Nucleic Acid Atoms 0
    Heterogen Atoms 17
    Solvent Atoms 283
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Controls: EPICS, GUI: BLU-ICE
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building AMoRE
    data collection GUI: version: BLU-ICE
    data collection Controls: version: EPICS
     
     
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