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X-RAY DIFFRACTION
Materials and Methods page
4FQG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 9
    Temperature 277.0
    Details 0.016 M NiCl2, 0.1 M Tris-HCl, 16% polyethylene glycol monomethyl ether 2000, and 0.13 M glycine, pH 9, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 27.92 α = 90
    b = 77.09 β = 96.01
    c = 95.18 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2009-12-17
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-04-12
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol MAD
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 0.9796
    Site APS
    Beamline 22-BM
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 0.9794
    Site APS
    Beamline 22-BM
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 0.9719
    Site APS
    Beamline 22-BM
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0001
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 27256
    Number Reflections(Observed) 26788
    Percent Possible(Observed) 98.3
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.03
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.134
    Mean I Over Sigma(Observed) 11.7
    Redundancy 4.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.0
    Resolution(Low) 24.797
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27256
    Number of Reflections(Observed) 26272
    Number of Reflections(R-Free) 1314
    Percent Reflections(Observed) 96.45
    R-Factor(Observed) 0.1919
    R-Work 0.1892
    R-Free 0.2408
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.2353
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.3241
    Anisotropic B[2][2] -5.1785
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.9432
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9972
    Shell Resolution(Low) 2.0772
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1957
    R-Factor(R-Free) 0.288
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0772
    Shell Resolution(Low) 2.1716
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2804
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.2306
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1716
    Shell Resolution(Low) 2.2861
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2509
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2782
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2861
    Shell Resolution(Low) 2.4292
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4292
    Shell Resolution(Low) 2.6165
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2849
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2435
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6165
    Shell Resolution(Low) 2.8795
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2859
    R-Factor(R-Work) 0.2087
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8795
    Shell Resolution(Low) 3.2953
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2953
    Shell Resolution(Low) 4.1486
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2409
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1486
    Shell Resolution(Low) 24.7991
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 2893
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.065
    f_dihedral_angle_d 12.925
    f_angle_d 0.917
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3193
    Nucleic Acid Atoms 0
    Heterogen Atoms 3
    Solvent Atoms 502
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement REFMAC version: 5.5.0072
    model building SOLVE
    data collection HKL-2000