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X-RAY DIFFRACTION
Materials and Methods page
4FQ2
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion
    pH 5.5
    Temperature 298.0
    Details PEG 3350, Bis-Tris HCl, NaCl, pH 5.5, vapor diffusion, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.38 α = 90
    b = 40.26 β = 95.39
    c = 84.46 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-01-28
     
    Diffraction Radiation
    Monochromator LIQUID NITROGEN-COOLED DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List 1.033
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.7
    Resolution(Low) 36.31
    Number Reflections(All) 42465
    Number Reflections(Observed) 42465
    Percent Possible(Observed) 94.0
    Redundancy 2.7
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.8
    Percent Possible(All) 80.6
    R Merge I(Observed) 0.849
    Mean I Over Sigma(Observed) 0.9
    R-Sym I(Observed) 0.849
    Redundancy 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 36.313
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 32856
    Number of Reflections(Observed) 31363
    Number of Reflections(R-Free) 1479
    Percent Reflections(Observed) 95.46
    R-Factor(Observed) 0.1885
    R-Work 0.1868
    R-Free 0.2229
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.1653
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.7781
    Anisotropic B[2][2] 2.1845
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.9808
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9613
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.2414
    R-Factor(R-Free) 0.2916
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9613
    Shell Resolution(Low) 2.0314
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2183
    R-Factor(R-Free) 0.2522
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0314
    Shell Resolution(Low) 2.1128
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1128
    Shell Resolution(Low) 2.2089
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.236
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2089
    Shell Resolution(Low) 2.3253
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.2033
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3253
    Shell Resolution(Low) 2.471
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.2209
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.471
    Shell Resolution(Low) 2.6617
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2776
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6617
    Shell Resolution(Low) 2.9295
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2763
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9295
    Shell Resolution(Low) 3.3531
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3531
    Shell Resolution(Low) 4.2236
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.2015
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2236
    Shell Resolution(Low) 36.3198
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1651
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.079
    f_dihedral_angle_d 15.379
    f_angle_d 1.234
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3360
    Nucleic Acid Atoms 0
    Heterogen Atoms 20
    Solvent Atoms 305
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction SCALA version: 3.3.16