X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 291.0
Details 18% PEG4000, 0.1 M Tris, pH 7.5, 0.2 M calcium chloride, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 126.79 α = 90
b = 126.79 β = 90
c = 107.32 γ = 120
Symmetry
Space Group P 65

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2011-11-24
Diffraction Radiation
Monochromator Protocol
double flat crystal Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LNLS BEAMLINE W01B-MX2 1.459 LNLS W01B-MX2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 50 99.7 -- 0.083 -- 10.5 57146 57146 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.1 2.18 99.1 -- 0.589 3.86 8.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.1 41.5 -- -- 54199 54199 2858 99.56 -- 0.18908 0.18647 0.23819 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1 2.152 -- 201 3977 0.243 0.272 -- 98.26
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 39.457
Anisotropic B[1][1] -0.71
Anisotropic B[1][2] -0.35
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.71
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.06
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 3.718
r_scbond_it 2.392
r_mcangle_it 1.812
r_mcbond_other 0.209
r_mcbond_it 1.003
r_gen_planes_other 0.002
r_gen_planes_refined 0.008
r_chiral_restr 0.091
r_dihedral_angle_4_deg 19.003
r_dihedral_angle_3_deg 16.348
r_dihedral_angle_2_deg 36.679
r_dihedral_angle_1_deg 6.014
r_angle_other_deg 0.929
r_angle_refined_deg 1.529
r_bond_other_d 0.001
r_bond_refined_d 0.016
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5559
Nucleic Acid Atoms 0
Heterogen Atoms 113
Solvent Atoms 363

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
REFMAC 5.5.0110 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0110 refinement
Phaser model building
HKL-2000 data collection