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X-RAY DIFFRACTION
Materials and Methods page
4FNU
  •   Crystallization Hide
    Crystallization Experiments
    pH 8.5
    Temperature 292.0
    Details 12% polyethylene glycol 4000, 0.1M Tris, 0.02M stachyose, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 154.07 α = 90
    b = 154.07 β = 90
    c = 238.02 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Collection Date 2012-02-05
     
    Diffraction Radiation
    Monochromator YALE MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength 1
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.6
    Resolution(Low) 20
    Number Reflections(Observed) 38121
    Percent Possible(Observed) 99.0
    B(Isotropic) From Wilson Plot 75.5
    Redundancy 5.5
     
    High Resolution Shell Details
    Resolution(High) 3.6
    Resolution(Low) 3.69
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.45
    Mean I Over Sigma(Observed) 3.5
    Redundancy 4.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.6
    Resolution(Low) 19.922
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 38114
    Number of Reflections(Observed) 38114
    Number of Reflections(R-Free) 1904
    Percent Reflections(Observed) 99.67
    R-Factor(Observed) 0.24
    R-Work 0.2377
    R-Free 0.2822
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6001
    Shell Resolution(Low) 3.6896
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.3467
    R-Factor(R-Free) 0.3866
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6896
    Shell Resolution(Low) 3.7887
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2538
    R-Factor(R-Work) 0.315
    R-Factor(R-Free) 0.3865
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7887
    Shell Resolution(Low) 3.8994
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.3056
    R-Factor(R-Free) 0.3533
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8994
    Shell Resolution(Low) 4.0242
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.312
    R-Factor(R-Free) 0.4092
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0242
    Shell Resolution(Low) 4.1668
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2817
    R-Factor(R-Free) 0.3216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1668
    Shell Resolution(Low) 4.332
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.2658
    R-Factor(R-Free) 0.3049
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.332
    Shell Resolution(Low) 4.527
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2488
    R-Factor(R-Free) 0.3353
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.527
    Shell Resolution(Low) 4.7626
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.2396
    R-Factor(R-Free) 0.285
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7626
    Shell Resolution(Low) 5.0564
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2574
    R-Factor(R-Work) 0.2285
    R-Factor(R-Free) 0.2717
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0564
    Shell Resolution(Low) 5.4394
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.3041
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4394
    Shell Resolution(Low) 5.9734
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2289
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9734
    Shell Resolution(Low) 6.8074
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.2214
    R-Factor(R-Free) 0.258
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.8074
    Shell Resolution(Low) 8.4656
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.241
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.4656
    Shell Resolution(Low) 19.9225
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.046
    f_dihedral_angle_d 19.54
    f_angle_d 0.732
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23152
    Nucleic Acid Atoms 0
    Heterogen Atoms 180
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building MOLREP
    data collection ADSC version: Quantum