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X-RAY DIFFRACTION
Materials and Methods page
4FNT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.1
    Temperature 289.0
    Details 20% polyethylene glycol 3350, 0.2M potassium acetate, pH 8.1, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 149.68 α = 90
    b = 149.68 β = 90
    c = 234.77 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Collection Date 2011-11-17
     
    Diffraction Radiation
    Monochromator YALE MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 0.98
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 20
    Number Reflections(All) 93989
    Number Reflections(Observed) 92575
    Percent Possible(Observed) 98.5
    B(Isotropic) From Wilson Plot 52.3
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.67
    Percent Possible(All) 99.7
    R Merge I(Observed) 0.389
    Mean I Over Sigma(Observed) 2.8
    Redundancy 3.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 19.887
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 92570
    Number of Reflections(Observed) 92571
    Number of Reflections(R-Free) 4628
    Percent Reflections(Observed) 98.76
    R-Factor(Observed) 0.1722
    R-Work 0.1696
    R-Free 0.2212
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.6173
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.6173
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.2346
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.6295
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.2102
    R-Factor(R-Free) 0.3063
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6295
    Shell Resolution(Low) 2.6604
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2883
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.2894
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6604
    Shell Resolution(Low) 2.6927
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2932
    R-Factor(R-Work) 0.2151
    R-Factor(R-Free) 0.3045
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6927
    Shell Resolution(Low) 2.7267
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.2146
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7267
    Shell Resolution(Low) 2.7625
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2932
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.2822
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7625
    Shell Resolution(Low) 2.8003
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2906
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8003
    Shell Resolution(Low) 2.8402
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2943
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.303
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8402
    Shell Resolution(Low) 2.8824
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2926
    R-Factor(R-Work) 0.1974
    R-Factor(R-Free) 0.2482
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8824
    Shell Resolution(Low) 2.9273
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2913
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.2628
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9273
    Shell Resolution(Low) 2.9752
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.3098
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9752
    Shell Resolution(Low) 3.0263
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2894
    R-Factor(R-Work) 0.21
    R-Factor(R-Free) 0.2991
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0263
    Shell Resolution(Low) 3.0811
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2914
    R-Factor(R-Work) 0.1978
    R-Factor(R-Free) 0.2398
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0811
    Shell Resolution(Low) 3.1402
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2950
    R-Factor(R-Work) 0.2007
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1402
    Shell Resolution(Low) 3.204
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2959
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2412
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.204
    Shell Resolution(Low) 3.2734
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2952
    R-Factor(R-Work) 0.2012
    R-Factor(R-Free) 0.2561
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2734
    Shell Resolution(Low) 3.3492
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2925
    R-Factor(R-Work) 0.197
    R-Factor(R-Free) 0.2774
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3492
    Shell Resolution(Low) 3.4325
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2937
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2286
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4325
    Shell Resolution(Low) 3.5248
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2910
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2976
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5248
    Shell Resolution(Low) 3.6279
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2914
    R-Factor(R-Work) 0.1792
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6279
    Shell Resolution(Low) 3.7443
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2893
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2199
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7443
    Shell Resolution(Low) 3.8772
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2870
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.203
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8772
    Shell Resolution(Low) 4.0312
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2873
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2169
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0312
    Shell Resolution(Low) 4.213
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2939
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.1804
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.213
    Shell Resolution(Low) 4.4328
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2950
    R-Factor(R-Work) 0.1334
    R-Factor(R-Free) 0.1722
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4328
    Shell Resolution(Low) 4.7071
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2953
    R-Factor(R-Work) 0.1278
    R-Factor(R-Free) 0.1508
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7071
    Shell Resolution(Low) 5.065
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2937
    R-Factor(R-Work) 0.1333
    R-Factor(R-Free) 0.169
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.065
    Shell Resolution(Low) 5.5645
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2905
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.2004
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5645
    Shell Resolution(Low) 6.3467
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2927
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.2273
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3467
    Shell Resolution(Low) 7.9115
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3052
    R-Factor(R-Work) 0.1674
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.9115
    Shell Resolution(Low) 19.8876
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3095
    R-Factor(R-Work) 0.1441
    R-Factor(R-Free) 0.1823
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.052
    f_dihedral_angle_d 14.266
    f_angle_d 0.742
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23160
    Nucleic Acid Atoms 0
    Heterogen Atoms 102
    Solvent Atoms 357
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XDS
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building MOLREP
    data collection ADSC version: Quantum