POP-OUT | CLOSE

An Information Portal to 108395 Biological Macromolecular Structures

X-RAY DIFFRACTION
Materials and Methods page
4FNS
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.8
    Temperature 292.0
    Details 20% PEG 3350, 0.2M Potassium nitrate, pH 6.8, VAPOR DIFFUSION, SITTING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 150.3 α = 90
    b = 150.3 β = 90
    c = 233.36 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
    Collection Date 2011-08-01
     
    Diffraction Radiation
    Monochromator YALE MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength List 1.18
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(All) 94216
    Number Reflections(Observed) 91886
    Percent Possible(Observed) 97.5
    B(Isotropic) From Wilson Plot 32.6
    Redundancy 2.1
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.67
    Percent Possible(All) 96.7
    R Merge I(Observed) 0.31
    Mean I Over Sigma(Observed) 3.0
    Redundancy 2.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 49.197
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 91886
    Number of Reflections(Observed) 91886
    Number of Reflections(R-Free) 4596
    Percent Reflections(Observed) 97.61
    R-Factor(Observed) 0.1767
    R-Work 0.1738
    R-Free 0.231
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.8759
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.8759
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.7517
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.6295
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2658
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6295
    Shell Resolution(Low) 2.6605
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2829
    R-Factor(R-Work) 0.2173
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6605
    Shell Resolution(Low) 2.6929
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2854
    R-Factor(R-Work) 0.2181
    R-Factor(R-Free) 0.2842
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6929
    Shell Resolution(Low) 2.727
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2883
    R-Factor(R-Work) 0.2198
    R-Factor(R-Free) 0.3284
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.727
    Shell Resolution(Low) 2.7629
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.2175
    R-Factor(R-Free) 0.3206
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7629
    Shell Resolution(Low) 2.8007
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2916
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2687
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8007
    Shell Resolution(Low) 2.8407
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.209
    R-Factor(R-Free) 0.3282
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8407
    Shell Resolution(Low) 2.8831
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2876
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.287
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8831
    Shell Resolution(Low) 2.9282
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2876
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9282
    Shell Resolution(Low) 2.9762
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2910
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2981
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9762
    Shell Resolution(Low) 3.0275
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2886
    R-Factor(R-Work) 0.2017
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0275
    Shell Resolution(Low) 3.0825
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2908
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2889
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0825
    Shell Resolution(Low) 3.1418
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2897
    R-Factor(R-Work) 0.1888
    R-Factor(R-Free) 0.2514
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1418
    Shell Resolution(Low) 3.2059
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2947
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.2659
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2059
    Shell Resolution(Low) 3.2756
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2887
    R-Factor(R-Work) 0.194
    R-Factor(R-Free) 0.2736
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2756
    Shell Resolution(Low) 3.3518
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3518
    Shell Resolution(Low) 3.4356
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2876
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4356
    Shell Resolution(Low) 3.5285
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2915
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5285
    Shell Resolution(Low) 3.6323
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2890
    R-Factor(R-Work) 0.1605
    R-Factor(R-Free) 0.2493
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6323
    Shell Resolution(Low) 3.7495
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2910
    R-Factor(R-Work) 0.1594
    R-Factor(R-Free) 0.2148
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7495
    Shell Resolution(Low) 3.8834
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2873
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8834
    Shell Resolution(Low) 4.0388
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2889
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0388
    Shell Resolution(Low) 4.2226
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2917
    R-Factor(R-Work) 0.1446
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2226
    Shell Resolution(Low) 4.4451
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2940
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4451
    Shell Resolution(Low) 4.7233
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2948
    R-Factor(R-Work) 0.1398
    R-Factor(R-Free) 0.1807
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7233
    Shell Resolution(Low) 5.0877
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2939
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.178
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0877
    Shell Resolution(Low) 5.599
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2951
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.1948
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.599
    Shell Resolution(Low) 6.4077
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2938
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2292
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4077
    Shell Resolution(Low) 8.0673
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.2098
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.0673
    Shell Resolution(Low) 49.206
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3144
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.1893
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.044
    f_dihedral_angle_d 10.911
    f_angle_d 0.609
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23148
    Nucleic Acid Atoms 0
    Heterogen Atoms 88
    Solvent Atoms 980
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building MOLREP
    data collection ADSC version: Quantum