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X-RAY DIFFRACTION
Materials and Methods page
4FNR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 292.0
    Details 20% PEG 4000, 80mM sodium acetate, 6.4% isopropanol, pH 7, VAPOR DIFFUSION, SITTING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 150 α = 90
    b = 150 β = 90
    c = 233 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2010-11-29
     
    Diffraction Radiation
    Monochromator YALE MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-2
    Wavelength List 0.87
    Site ESRF
    Beamline ID23-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.2
    Resolution(Low) 20
    Number Reflections(All) 50651
    Number Reflections(Observed) 50372
    Percent Possible(Observed) 99.4
    B(Isotropic) From Wilson Plot 34.5
    Redundancy 4.3
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.28
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.449
    Mean I Over Sigma(Observed) 3.4
    Redundancy 4.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.2
    Resolution(Low) 19.999
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 50367
    Number of Reflections(Observed) 50367
    Number of Reflections(R-Free) 2519
    Percent Reflections(Observed) 99.94
    R-Factor(Observed) 0.1769
    R-Work 0.1743
    R-Free 0.2256
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.213
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.213
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.426
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2
    Shell Resolution(Low) 3.2613
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.2295
    R-Factor(R-Free) 0.3052
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2613
    Shell Resolution(Low) 3.3276
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3276
    Shell Resolution(Low) 3.3996
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2149
    R-Factor(R-Free) 0.2765
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3996
    Shell Resolution(Low) 3.4783
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.2117
    R-Factor(R-Free) 0.281
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4783
    Shell Resolution(Low) 3.5648
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5648
    Shell Resolution(Low) 3.6606
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.2588
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6606
    Shell Resolution(Low) 3.7676
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2745
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7676
    Shell Resolution(Low) 3.8884
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.2077
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8884
    Shell Resolution(Low) 4.0263
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.2239
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0263
    Shell Resolution(Low) 4.1861
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.1571
    R-Factor(R-Free) 0.2217
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1861
    Shell Resolution(Low) 4.3747
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1526
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3747
    Shell Resolution(Low) 4.6027
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1454
    R-Factor(R-Free) 0.1924
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6027
    Shell Resolution(Low) 4.8871
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1505
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8871
    Shell Resolution(Low) 5.2581
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1622
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2581
    Shell Resolution(Low) 5.7757
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.1965
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7757
    Shell Resolution(Low) 6.5852
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1843
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5852
    Shell Resolution(Low) 8.2003
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2003
    Shell Resolution(Low) 19.9998
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2812
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.171
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.047
    f_dihedral_angle_d 12.485
    f_angle_d 0.629
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23148
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 4
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building MOLREP
    data collection ADSC version: Quantum