POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4FNQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 292.0
    Details 1.7M ammonium sulfate 20mM HEPES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 87.3 α = 90
    b = 113.1 β = 90
    c = 161.6 γ = 90
     
    Space Group
    Space Group Name:    I 2 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2005-06-01
     
    Diffraction Radiation
    Monochromator YALE MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM30A
    Wavelength List 0.98
    Site ESRF
    Beamline BM30A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.7
    Resolution(Low) 20
    Number Reflections(All) 87928
    Number Reflections(Observed) 84878
    Percent Possible(Observed) 96.5
    B(Isotropic) From Wilson Plot 22.1
    Redundancy 5.3
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.74
    Percent Possible(All) 73.7
    R Merge I(Observed) 0.291
    Mean I Over Sigma(Observed) 5.1
    Redundancy 2.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 19.471
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 84833
    Number of Reflections(Observed) 73179
    Number of Reflections(R-Free) 3659
    Percent Reflections(Observed) 98.75
    R-Factor(Observed) 0.1825
    R-Work 0.1811
    R-Free 0.2089
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.1456
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0118
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.1574
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8237
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.2202
    R-Factor(R-Free) 0.2802
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8237
    Shell Resolution(Low) 1.8486
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2154
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8486
    Shell Resolution(Low) 1.875
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.2263
    R-Factor(R-Free) 0.2641
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.875
    Shell Resolution(Low) 1.903
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.2267
    R-Factor(R-Free) 0.2845
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.903
    Shell Resolution(Low) 1.9327
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2137
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9327
    Shell Resolution(Low) 1.9644
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.2052
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9644
    Shell Resolution(Low) 1.9982
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1842
    R-Factor(R-Free) 0.2178
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9982
    Shell Resolution(Low) 2.0345
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1719
    R-Factor(R-Free) 0.2097
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0345
    Shell Resolution(Low) 2.0736
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0736
    Shell Resolution(Low) 2.1159
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.202
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1159
    Shell Resolution(Low) 2.1618
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.2221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1618
    Shell Resolution(Low) 2.212
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2119
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.212
    Shell Resolution(Low) 2.2673
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2673
    Shell Resolution(Low) 2.3285
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3285
    Shell Resolution(Low) 2.3969
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1735
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3969
    Shell Resolution(Low) 2.4741
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.1975
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4741
    Shell Resolution(Low) 2.5623
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.1968
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5623
    Shell Resolution(Low) 2.6647
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6647
    Shell Resolution(Low) 2.7856
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.1957
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7856
    Shell Resolution(Low) 2.932
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.932
    Shell Resolution(Low) 3.115
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.115
    Shell Resolution(Low) 3.3544
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.1741
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3544
    Shell Resolution(Low) 3.6899
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1668
    R-Factor(R-Free) 0.2015
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6899
    Shell Resolution(Low) 4.2191
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.1695
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2191
    Shell Resolution(Low) 5.2979
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.1808
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2979
    Shell Resolution(Low) 19.4724
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.2575
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.083
    f_dihedral_angle_d 14.239
    f_angle_d 1.172
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5832
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 396
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building MOLREP
    data collection ADSC version: Quantum