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X-RAY DIFFRACTION
Materials and Methods page
4FNP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.9
    Temperature 292.0
    Details 20% PEG 3350, 0.2M sodium iodide, 10% ethylene glycol, 5% polyvinyl pyrrolidone K15, pH 6.9, VAPOR DIFFUSION, SITTING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 150.5 α = 90
    b = 150.5 β = 90
    c = 234.1 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR CCD 165 mm
    Collection Date 2005-06-01
     
    Diffraction Radiation
    Monochromator YALE MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM30A
    Wavelength List 0.98
    Site ESRF
    Beamline BM30A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.8
    Resolution(Low) 20
    Number Reflections(All) 76055
    Number Reflections(Observed) 75205
    Percent Possible(Observed) 98.9
    B(Isotropic) From Wilson Plot 15.1
    Redundancy 4.1
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 3.0
    Percent Possible(All) 96.2
    R Merge I(Observed) 0.437
    Mean I Over Sigma(Observed) 3.85
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.803
    Resolution(Low) 19.833
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 75201
    Number of Reflections(Observed) 75201
    Number of Reflections(R-Free) 3761
    Percent Reflections(Observed) 99.58
    R-Factor(Observed) 0.197
    R-Work 0.1944
    R-Free 0.2471
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -9.7807
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -9.7807
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -9.5577
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8034
    Shell Resolution(Low) 2.8388
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2374
    R-Factor(R-Work) 0.2624
    R-Factor(R-Free) 0.3196
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8388
    Shell Resolution(Low) 2.876
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2489
    R-Factor(R-Free) 0.319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.876
    Shell Resolution(Low) 2.9153
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.2405
    R-Factor(R-Free) 0.3203
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9153
    Shell Resolution(Low) 2.9568
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.3195
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9568
    Shell Resolution(Low) 3.0008
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2349
    R-Factor(R-Free) 0.2602
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0008
    Shell Resolution(Low) 3.0475
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2351
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0475
    Shell Resolution(Low) 3.0973
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.2316
    R-Factor(R-Free) 0.322
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0973
    Shell Resolution(Low) 3.1505
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.2316
    R-Factor(R-Free) 0.2936
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1505
    Shell Resolution(Low) 3.2076
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.3086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2076
    Shell Resolution(Low) 3.269
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.2953
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.269
    Shell Resolution(Low) 3.3354
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.2145
    R-Factor(R-Free) 0.2805
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3354
    Shell Resolution(Low) 3.4076
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.21
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4076
    Shell Resolution(Low) 3.4865
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2533
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4865
    Shell Resolution(Low) 3.5732
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5732
    Shell Resolution(Low) 3.6692
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2621
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6692
    Shell Resolution(Low) 3.7764
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2325
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7764
    Shell Resolution(Low) 3.8974
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.2359
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8974
    Shell Resolution(Low) 4.0356
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.2243
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0356
    Shell Resolution(Low) 4.1957
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1604
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1957
    Shell Resolution(Low) 4.3847
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.1539
    R-Factor(R-Free) 0.2233
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3847
    Shell Resolution(Low) 4.6132
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1504
    R-Factor(R-Free) 0.2007
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6132
    Shell Resolution(Low) 4.8981
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1515
    R-Factor(R-Free) 0.1849
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8981
    Shell Resolution(Low) 5.2697
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.2068
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2697
    Shell Resolution(Low) 5.788
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.2265
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.788
    Shell Resolution(Low) 6.5984
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5984
    Shell Resolution(Low) 8.2139
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.1951
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2139
    Shell Resolution(Low) 19.8331
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2826
    R-Factor(R-Work) 0.1729
    R-Factor(R-Free) 0.1676
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.049
    f_dihedral_angle_d 12.357
    f_angle_d 0.656
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23148
    Nucleic Acid Atoms 0
    Heterogen Atoms 60
    Solvent Atoms 71
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building MOLREP
    data collection ADSC version: Quantum