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X-RAY DIFFRACTION
Materials and Methods page
4FKD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.2
    Temperature 293.0
    Details 0.1 M Lithium acetate and 20% PEG 3350, pH 7.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.85 α = 90
    b = 65.85 β = 90
    c = 27.12 γ = 120
     
    Space Group
    Space Group Name:    P 61
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS HTC
    Collection Date 2009-11-11
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU FR-E+ SUPERBRIGHT
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.63
    Resolution(Low) 28.51
    Number Reflections(Observed) 7559
    Percent Possible(Observed) 88.39
    R Merge I(Observed) 0.044
    Redundancy 6.0
     
    High Resolution Shell Details
    Resolution(High) 1.63
    Resolution(Low) 1.72
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.115
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.633
    Resolution(Low) 28.514
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 7550
    Number of Reflections(R-Free) 332
    Percent Reflections(Observed) 88.39
    R-Factor(All) 0.1729
    R-Factor(Observed) 0.1729
    R-Work 0.1714
    R-Free 0.2042
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.1944
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.1944
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.3887
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6333
    Shell Resolution(Low) 2.0576
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3586
    R-Factor(R-Work) 0.2067
    R-Factor(R-Free) 0.249
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0576
    Shell Resolution(Low) 28.5182
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3632
    R-Factor(R-Work) 0.158
    R-Factor(R-Free) 0.1849
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.068
    f_dihedral_angle_d 11.493
    f_angle_d 1.03
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 509
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 130
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER MR
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER version: MR
    data collection CrystalClear