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X-RAY DIFFRACTION
Materials and Methods page
4FJU
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 6
    Temperature 320.0
    Details 0.1M MES, 4.0M NACL, pH 6.0, EVAPORATION, temperature 320K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 162.76 α = 90
    b = 162.76 β = 90
    c = 61.45 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2010-10-05
     
    Diffraction Radiation
    Monochromator MIRROR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PAL/PLS BEAMLINE 6C1
    Wavelength 1.2398
    Site PAL/PLS
    Beamline 6C1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.77
    Resolution(Low) 50
    Number Reflections(Observed) 74082
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.074
    Redundancy 15.7
     
    High Resolution Shell Details
    Resolution(High) 1.77
    Resolution(Low) 1.83
    Percent Possible(All) 97.3
    R Merge I(Observed) 0.583
    Mean I Over Sigma(Observed) 4.6
    Redundancy 15.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.771
    Resolution(Low) 36.393
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 74082
    Number of Reflections(R-Free) 7080
    Percent Reflections(Observed) 99.53
    R-Factor(Observed) 0.2296
    R-Work 0.2292
    R-Free 0.2484
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.112
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.112
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.224
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7714
    Shell Resolution(Low) 1.8157
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 5509
    R-Factor(R-Work) 0.2993
    R-Factor(R-Free) 0.2813
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8157
    Shell Resolution(Low) 1.8648
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5558
    R-Factor(R-Work) 0.2918
    R-Factor(R-Free) 0.3404
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8648
    Shell Resolution(Low) 1.9197
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5510
    R-Factor(R-Work) 0.2825
    R-Factor(R-Free) 0.3516
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9197
    Shell Resolution(Low) 1.9816
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5519
    R-Factor(R-Work) 0.2629
    R-Factor(R-Free) 0.3156
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9816
    Shell Resolution(Low) 2.0524
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5541
    R-Factor(R-Work) 0.2526
    R-Factor(R-Free) 0.2746
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0524
    Shell Resolution(Low) 2.1346
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5518
    R-Factor(R-Work) 0.2382
    R-Factor(R-Free) 0.2677
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1346
    Shell Resolution(Low) 2.2317
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 5491
    R-Factor(R-Work) 0.2555
    R-Factor(R-Free) 0.2668
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2317
    Shell Resolution(Low) 2.3494
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 5466
    R-Factor(R-Work) 0.2558
    R-Factor(R-Free) 0.3003
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3494
    Shell Resolution(Low) 2.4965
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5541
    R-Factor(R-Work) 0.2382
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4965
    Shell Resolution(Low) 2.6892
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 5588
    R-Factor(R-Work) 0.2418
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6892
    Shell Resolution(Low) 2.9598
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5619
    R-Factor(R-Work) 0.2222
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9598
    Shell Resolution(Low) 3.3878
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 5634
    R-Factor(R-Work) 0.2258
    R-Factor(R-Free) 0.262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3878
    Shell Resolution(Low) 4.2672
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5650
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2672
    Shell Resolution(Low) 36.401
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 5936
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_dihedral_angle_d 15.61
    f_angle_d 1.141
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4949
    Nucleic Acid Atoms 0
    Heterogen Atoms 93
    Solvent Atoms 707
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement CNS
    model building PHASES