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X-RAY DIFFRACTION
Materials and Methods page
4FJS
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 6
    Details 0.1M MES, 4.0M NACL, pH 6.0, EVAPORATION
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 162.76 α = 90
    b = 162.76 β = 90
    c = 61.45 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-05-26
     
    Diffraction Radiation
    Monochromator MIRROR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PAL/PLS BEAMLINE 4A
    Wavelength 1.0000
    Site PAL/PLS
    Beamline 4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.7
    Resolution(Low) 50
    Number Reflections(Observed) 46352
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.123
    Redundancy 23.2
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.606
    Redundancy 16.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.13
    Resolution(Low) 49.18
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 46305
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.0
    R-Factor(Observed) 0.223
    R-Work 0.222
    R-Free 0.24
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 1.321
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.321
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.6419
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1301
    Shell Resolution(Low) 2.1834
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2949
    R-Factor(R-Work) 0.2835
    R-Factor(R-Free) 0.289
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1834
    Shell Resolution(Low) 2.2425
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3042
    R-Factor(R-Work) 0.2696
    R-Factor(R-Free) 0.2959
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2425
    Shell Resolution(Low) 2.3084
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3089
    R-Factor(R-Work) 0.268
    R-Factor(R-Free) 0.2821
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3084
    Shell Resolution(Low) 2.3829
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3128
    R-Factor(R-Work) 0.2609
    R-Factor(R-Free) 0.2661
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3829
    Shell Resolution(Low) 2.4681
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3128
    R-Factor(R-Work) 0.2633
    R-Factor(R-Free) 0.376
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4681
    Shell Resolution(Low) 2.5669
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3150
    R-Factor(R-Work) 0.2727
    R-Factor(R-Free) 0.3014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5669
    Shell Resolution(Low) 2.6837
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3158
    R-Factor(R-Work) 0.2621
    R-Factor(R-Free) 0.3114
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6837
    Shell Resolution(Low) 2.8252
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3155
    R-Factor(R-Work) 0.2503
    R-Factor(R-Free) 0.2697
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8252
    Shell Resolution(Low) 3.0022
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3178
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.2804
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0022
    Shell Resolution(Low) 3.234
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3189
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.234
    Shell Resolution(Low) 3.5593
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3205
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5593
    Shell Resolution(Low) 4.0742
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3233
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.1825
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0742
    Shell Resolution(Low) 5.1321
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3272
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.1786
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1321
    Shell Resolution(Low) 49.194
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3429
    R-Factor(R-Work) 0.2167
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.079
    f_dihedral_angle_d 17.15
    f_angle_d 1.113
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4959
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 500
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.2_869)
     
    Software
    refinement CNS
    model building PHASER