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X-RAY DIFFRACTION
Materials and Methods page
4FIW
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.15
    Details 12% glycerol, 0.1M Tris pH 8.5, 1.8M ammonium sulphate, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.77 α = 90
    b = 61.77 β = 90
    c = 77.19 γ = 120
     
    Space Group
    Space Group Name:    P 65 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-03-10
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 0.9793
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.5
    Resolution(Low) 28.67
    Number Reflections(Observed) 14472
    Percent Possible(Observed) 98.3
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.53
    Percent Possible(All) 94.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.5011
    Resolution(Low) 28.675
    Cut-off Sigma(F) 2.01
    Number of Reflections(all) 14242
    Number of Reflections(Observed) 14472
    Number of Reflections(R-Free) 1447
    Percent Reflections(Observed) 99.98
    R-Factor(Observed) 0.1931
    R-Work 0.1908
    R-Free 0.2134
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.0664
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.0664
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.1328
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5011
    Shell Resolution(Low) 1.5548
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.1924
    R-Factor(R-Free) 0.2241
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5548
    Shell Resolution(Low) 1.617
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1278
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.617
    Shell Resolution(Low) 1.6906
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1258
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2191
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6906
    Shell Resolution(Low) 1.7797
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1282
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2163
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7797
    Shell Resolution(Low) 1.8912
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1280
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.2111
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8912
    Shell Resolution(Low) 2.0372
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1286
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0372
    Shell Resolution(Low) 2.2421
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1306
    R-Factor(R-Work) 0.1734
    R-Factor(R-Free) 0.195
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2421
    Shell Resolution(Low) 2.5664
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1308
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.2151
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5664
    Shell Resolution(Low) 3.2327
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1336
    R-Factor(R-Work) 0.1888
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2327
    Shell Resolution(Low) 28.6801
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1433
    R-Factor(R-Work) 0.2012
    R-Factor(R-Free) 0.195
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.068
    f_dihedral_angle_d 11.288
    f_angle_d 1.06
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 582
    Nucleic Acid Atoms 0
    Heterogen Atoms 17
    Solvent Atoms 66
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution BALBES
    Structure Refinement PHENIX (phenix.refine: 1.6_289)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6_289)
    model building BALBES
    data collection ADSC version: Quantum