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X-RAY DIFFRACTION
Materials and Methods page
4FIQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 297.0
    Details 100mM imidazole, 35% 2-methyl-2,4-pentanediol, 200mM MgCl2, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 59.29 α = 90
    b = 178.56 β = 102.97
    c = 109.23 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2005-04-06
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PAL/PLS BEAMLINE 4A
    Wavelength List 1.0629
    Site PAL/PLS
    Beamline 4A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.61
    Resolution(Low) 50
    Number Reflections(All) 420103
    Number Reflections(Observed) 66140
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.08
     
    High Resolution Shell Details
    Resolution(High) 2.61
    Resolution(Low) 2.7
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.373
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7
    Resolution(Low) 19.978
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 58910
    Number of Reflections(R-Free) 3007
    Percent Reflections(Observed) 97.43
    R-Factor(Observed) 0.1768
    R-Work 0.1731
    R-Free 0.2456
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.9375
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 7.4692
    Anisotropic B[2][2] -9.1603
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.2228
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7
    Shell Resolution(Low) 2.7442
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2473
    R-Factor(R-Work) 0.2378
    R-Factor(R-Free) 0.3246
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7442
    Shell Resolution(Low) 2.7914
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.238
    R-Factor(R-Free) 0.3307
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7914
    Shell Resolution(Low) 2.842
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2449
    R-Factor(R-Free) 0.3635
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.842
    Shell Resolution(Low) 2.8965
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2528
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.3133
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8965
    Shell Resolution(Low) 2.9554
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.2008
    R-Factor(R-Free) 0.2665
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9554
    Shell Resolution(Low) 3.0195
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2023
    R-Factor(R-Free) 0.308
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0195
    Shell Resolution(Low) 3.0895
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.2016
    R-Factor(R-Free) 0.3076
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0895
    Shell Resolution(Low) 3.1664
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2767
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1664
    Shell Resolution(Low) 3.2517
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2736
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2517
    Shell Resolution(Low) 3.3469
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2739
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3469
    Shell Resolution(Low) 3.4544
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2489
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4544
    Shell Resolution(Low) 3.5772
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5772
    Shell Resolution(Low) 3.7196
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7196
    Shell Resolution(Low) 3.8877
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.1668
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8877
    Shell Resolution(Low) 4.091
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.091
    Shell Resolution(Low) 4.3449
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1447
    R-Factor(R-Free) 0.2219
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3449
    Shell Resolution(Low) 4.6763
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1379
    R-Factor(R-Free) 0.1856
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6763
    Shell Resolution(Low) 5.1397
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.223
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1397
    Shell Resolution(Low) 5.8669
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2782
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8669
    Shell Resolution(Low) 7.3304
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.3304
    Shell Resolution(Low) 19.9782
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2789
    R-Factor(R-Work) 0.1348
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 16.448
    f_angle_d 1.185
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 14784
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 344
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building CNS
    data collection HKL-2000