X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 5.6
Temperature 291.0
Details EHG-ALPHA-1 AT 15 MG/ML IN CRYSTALLIZATION BUFFER (50 MM HEPES PH 6.5, 150 MM NACL, 10 MM MGCL2, 10 MM NAF, 30 MICROM ALCL3, AND 50 MICROM GDP) WAS MIXED 1:1 AND EQUILIBRATED AGAINST CRYSTALLIZATION SOLUTION CONTAINING 1.5 M AMMONIUM SULFATE, 175 MM K/NA TARTRATE, AND 100 MM SODIUM CITRATE PH 5.6. 250 MM AMMONIUM ACETATE WAS ADDED TO THE WELL SOLUTION AFTER SETTING THE DROPS, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.67 α = 90
b = 57.17 β = 90
c = 231.29 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 300 mm plate -- 2011-03-05
Diffraction Radiation
Monochromator Protocol
DOUBLE CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D -- APS 23-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 45.9 99.3 -- -- -- -- -- 43503 -- 1.37 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.62 100.0 0.982 -- 2.6 13.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.62 45.9 -- 1.37 -- 23398 1172 99.3 -- 0.193 0.189 0.258 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.62 2.7102 -- 203 3956 0.258 0.3644 -- 94.0
X Ray Diffraction 2.7102 2.8187 -- 218 4118 0.2379 0.342 -- 100.0
X Ray Diffraction 2.8187 2.947 -- 217 4133 0.2108 0.2807 -- 100.0
X Ray Diffraction 2.947 3.1023 -- 208 4208 0.2082 0.2836 -- 100.0
X Ray Diffraction 3.1023 3.2967 -- 225 4103 0.2127 0.2793 -- 100.0
X Ray Diffraction 3.2967 3.5511 -- 220 4210 0.1843 0.2645 -- 100.0
X Ray Diffraction 3.5511 3.9083 -- 212 4121 0.1726 0.2795 -- 100.0
X Ray Diffraction 3.9083 4.4734 -- 215 4194 0.1566 0.2321 -- 100.0
X Ray Diffraction 4.4734 5.6344 -- 222 4155 0.1568 0.1987 -- 100.0
X Ray Diffraction 5.6344 45.9 -- 213 4152 0.1936 0.2393 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 2.6672
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.0515
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.7187
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.079
f_dihedral_angle_d 18.742
f_angle_d 1.205
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4900
Nucleic Acid Atoms 0
Heterogen Atoms 56
Solvent Atoms 39

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX AUTOSOL Structure Solution
PHENIX (PHENIX.REFINE: 1.6_289) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: 1.6_289) refinement
PHENIX version: AUTOSOL model building