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X-RAY DIFFRACTION
Materials and Methods page
4FID
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.6
    Temperature 291.0
    Details EHG-ALPHA-1 AT 15 MG/ML IN CRYSTALLIZATION BUFFER (50 MM HEPES PH 6.5, 150 MM NACL, 10 MM MGCL2, 10 MM NAF, 30 MICROM ALCL3, AND 50 MICROM GDP) WAS MIXED 1:1 AND EQUILIBRATED AGAINST CRYSTALLIZATION SOLUTION CONTAINING 1.5 M AMMONIUM SULFATE, 175 MM K/NA TARTRATE, AND 100 MM SODIUM CITRATE PH 5.6. 250 MM AMMONIUM ACETATE WAS ADDED TO THE WELL SOLUTION AFTER SETTING THE DROPS, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.67 α = 90
    b = 57.17 β = 90
    c = 231.29 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2011-03-05
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-D
    Wavelength 0.97954
    Site APS
    Beamline 23-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.37
    Resolution(High) 2.6
    Resolution(Low) 45.9
    Number Reflections(Observed) 43503
    Percent Possible(Observed) 99.3
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.62
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.982
    Mean I Over Sigma(Observed) 2.6
    Redundancy 13.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.62
    Resolution(Low) 45.9
    Cut-off Sigma(F) 1.37
    Number of Reflections(Observed) 23398
    Number of Reflections(R-Free) 1172
    Percent Reflections(Observed) 99.3
    R-Factor(Observed) 0.193
    R-Work 0.189
    R-Free 0.258
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.6672
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0515
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.7187
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.62
    Shell Resolution(Low) 2.7102
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3956
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.3644
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7102
    Shell Resolution(Low) 2.8187
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4118
    R-Factor(R-Work) 0.2379
    R-Factor(R-Free) 0.342
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8187
    Shell Resolution(Low) 2.947
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4133
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2807
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.947
    Shell Resolution(Low) 3.1023
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 4208
    R-Factor(R-Work) 0.2082
    R-Factor(R-Free) 0.2836
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1023
    Shell Resolution(Low) 3.2967
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4103
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.2793
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2967
    Shell Resolution(Low) 3.5511
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4210
    R-Factor(R-Work) 0.1843
    R-Factor(R-Free) 0.2645
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5511
    Shell Resolution(Low) 3.9083
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 4121
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.2795
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9083
    Shell Resolution(Low) 4.4734
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4194
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.2321
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4734
    Shell Resolution(Low) 5.6344
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4155
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.1987
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6344
    Shell Resolution(Low) 45.9
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4152
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2393
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.079
    f_dihedral_angle_d 18.742
    f_angle_d 1.205
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4900
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 39
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX AUTOSOL
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6_289)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.6_289)
    model building PHENIX version: AUTOSOL